James Frame
16Patents
10h-index
4Co-inventors
61Inventor score
Filing activity: Nov 30, 1998 → Feb 4, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6250933A | Contact structure and production method thereof | Electricity | 117 | Expired |
| US6218203A | Method of producing a contact structure | Electricity | 86 | Expired |
| US5989994A | Method for producing contact structures | Electricity | 48 | Expired |
| US6420884B1 | Contact structure formed by photolithography process | Physics | 47 | Expired |
| US6232669A | Contact structure having silicon finger contactors and total stack-up structure using same | Electricity | 41 | Expired |
| US6297164A | Method for producing contact structures | Electricity | 34 | Expired |
| US6399900B1 | Contact structure formed over a groove | Physics | 31 | Expired |
| US6472890B2 | Method for producing a contact structure | Physics | 28 | Expired |
| US6856158B2 | Comparator circuit for semiconductor test system | Physics | 15 | Expired |
| US6466043B2 | Contact structure for electrical communication with contact targets | Physics | 12 | Expired |
| US6552528B2 | Modular interface between a device under test and a test head | Physics | 7 | Expired |
| US7504841B2 | High-impedance attenuator | Electricity | 5 | Active |
| US7728610B2 | Test instrument probe with MEMS attenuator circuit | Electricity | 4 | Active |
| US6822436B2 | Universal test interface between a device under test and a test head | Physics | 3 | Expired |
| US7292044B2 | Integrating time measurement circuit for a channel of a test card | Physics | 3 | Expired |
| US6576301B1 | Method of producing contact structure | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.