Inventor · Seojong-myeon, KR

Jong-Chae Kim

22Patents
4h-index
26Co-inventors
63Inventor score

Filing activity: Oct 31, 1997 → Nov 14, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7488637B2 CMOS image sensor and method for forming the same Electricity 37 Active
US6559475B1 Test pattern for evaluating a process of silicide film formation Electricity 10 Expired
US7378694B2 CMOS image sensor Electricity 10 Expired
US9159755B2 Image sensor and method for fabricating the same Electricity 4 Active
US11363224B2 Image sensing device Electricity 3 Active
US9287309B2 Isolation structure having a second impurity region with greater impurity doping concentration surrounds a first impurity region and method for forming the same, and image sensor including the isolation structure and method for fabricating the image sensor Electricity 3 Active
US8017490B2 Methods of forming metal-insulator-metal (MIM) capacitors with passivation layers on dielectric layers Electricity 2 Active
US9202950B2 Image sensor having 3D photoelectric conversion device Electricity 1 Active
US9159754B1 Image sensor having anti-reflective layer and fabricating method thereof Electricity 1 Active
US6218229A Method of fabricating semiconductor device having a dual-gate Electricity 1 Expired
US10015482B2 Image sensor having test pattern and offset correction method thereof Electricity 0 Active
US9911775B2 Image sensor and method for fabricating the same Electricity 0 Active
US12183762B2 Image sensing device Electricity 0 Active
US7652312B2 CMOS image sensor Electricity 0 Active
US9484374B2 Image sensor and method for fabricating the same Electricity 0 Active
US11552117B2 Image sensing device Electricity 0 Active
US11830893B2 Image sensing device Electricity 0 Active
US9184203B2 Image sensor and method for fabricating the same Electricity 0 Active
US11764238B2 Image sensing device Electricity 0 Active
US12324261B2 Image sensing device Electricity 0 Active
US9190440B2 Image sensor and method for fabricating the same Electricity 0 Active
US7749852B2 Methods of forming metal-insulator-metal (MIM) capacitors with passivation layers on dielectric layers Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.