Jong-Won Lim
54Patents
5h-index
61Co-inventors
75Inventor score
Filing activity: Dec 26, 2001 → Feb 14, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7387955B2 | Field effect transistor and method for manufacturing the same | Electricity | 9 | Active |
| US7902572B2 | Field effect transistor and method for manufacturing the same | Electricity | 7 | Active |
| US7419862B2 | Method of fabricating pseudomorphic high electron mobility transistor | Electricity | 7 | Active |
| US7970126B2 | Communication terminal with movable display | Electricity | 6 | Active |
| US7183149B2 | Method of manufacturing field effect transistor | Electricity | 5 | Expired |
| US8841154B2 | Method of manufacturing field effect type compound semiconductor device | Electricity | 5 | Active |
| US8841969B2 | Automatic gain control feedback amplifier | Electricity | 5 | Active |
| US8722474B2 | Semiconductor device including stepped gate electrode and fabrication method thereof | Electricity | 5 | Active |
| US6796723B2 | Submount for opto-electronic module and packaging method using the same | Electricity | 5 | Expired |
| US7671697B2 | High-isolation switching device for millimeter-wave band control circuit | Electricity | 4 | Active |
| US8723222B2 | Nitride electronic device and method for manufacturing the same | Electricity | 4 | Active |
| US7889023B2 | Switching circuit for millimeter waveband control circuit | Electricity | 4 | Active |
| US7429894B2 | Power device having connection structure compensating for reactance component of transmission line | Electricity | 3 | Active |
| US9178474B2 | Feedback amplifier | Electricity | 3 | Active |
| US10256811B2 | Cascode switch circuit including level shifter | Electricity | 2 | Active |
| US8053345B2 | Method for fabricating field effect transistor using a compound semiconductor | Electricity | 2 | Active |
| US9012920B2 | Wafer level packaged GaN power semiconductor device and the manufacturing method thereof | Electricity | 2 | Active |
| US6541319B2 | Method of manufacturing a self-aligned gate transistor with P-type impurities selectively implanted below the gate, source and drain electrodes | Electricity | 2 | Expired |
| US8853821B2 | Vertical capacitors and methods of forming the same | Electricity | 2 | Active |
| US8901608B2 | Transistor and method of fabricating the same | Electricity | 2 | Active |
| US9780176B2 | High reliability field effect power device and manufacturing method thereof | Electricity | 1 | Active |
| US8518794B2 | Semiconductor devices and methods of forming thereof | Electricity | 1 | Active |
| US8941231B2 | Electronic chip and method of fabricating the same | Electricity | 1 | Active |
| US9899226B2 | Semiconductor device and fabrication method thereof | Electricity | 1 | Active |
| US9634112B2 | Field effect transistor and method of fabricating the same | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.