Inventor · Hwaseong-si, KR

Jongwoo Sun

20Patents
1h-index
49Co-inventors
49Inventor score

Filing activity: Jun 13, 2016 → Apr 10, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US11264291B2 Sensor device and etching apparatus having the same Electricity 5 Active
US10643858B2 Method of etching substrate Electricity 1 Active
US12087554B2 Substrate treating apparatus and substrate treating system having the same Electricity 0 Active
US12315703B2 Plasma processing apparatus and methods of manufacturing semiconductor device using the same Electricity 0 Active
US11251022B2 Gas supply assembly and substrate processing apparatus including the same Electricity 0 Active
US11348760B2 Plasma processing apparatus and method of manufacturing semiconductor device using the same Electricity 0 Active
US12211672B2 Apparatus and method for plasma etching Electricity 0 Active
US10892145B2 Substrate processing apparatus, substrate processing method, and method of fabricating semiconductor device using the same Electricity 0 Active
US12068140B2 Method and system for monitoring substrate processing apparatus Electricity 0 Active
US10431432B2 Plasma treatment system including cover plate to insulate window Electricity 0 Active
US10861724B2 Substrate inspection apparatus and substrate processing system including the same Electricity 0 Active
US11715628B2 Method of forming plasma processing apparatus, related apparatus, and method of forming semiconductor device using the same Electricity 0 Active
US11984304B2 Apparatus and method for plasma etching Electricity 0 Active
US11430679B2 Semiconductor manufacturing apparatus Electricity 0 Active
US11215506B2 Substrate processing apparatus, substrate processing module, and semiconductor device fabrication method Physics 0 Active
US10935429B2 Substrate processing apparatus, substrate processing module, and semiconductor device fabrication method Physics 0 Active
US11929239B2 Plasma processing apparatus and semiconductor device manufacturing method using the same Electricity 0 Active
US11450545B2 Capacitively-coupled plasma substrate processing apparatus including a focus ring and a substrate processing method using the same Electricity 0 Active
US11862440B2 Semiconductor processing equipment including electrostatic chuck for plasma processing Electricity 0 Active
US11092495B2 Optical emission spectroscopy system, method of calibrating the same, and method of fabricating semiconductor device Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.