Inventor · Boise, ID, US

Kanwal K. Raina

40Patents
8h-index
10Co-inventors
68Inventor score

Filing activity: Sep 16, 1992 → May 2, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US6137214A Display device with silicon-containing adhesion layer Electricity 81 Expired
US6537427B1 Deposition of smooth aluminum films Electricity 54 Expired
US6106351A Methods of manufacturing microelectronic substrate assemblies for use in planarization processes Electricity 44 Expired
US6064149A Field emission device with silicon-containing adhesion layer Electricity 42 Expired
US6211608A Field emission device with buffer layer and method of making Electricity 23 Expired
US6015323A Field emission display cathode assembly government rights Electricity 18 Expired
US6348403B1 Suppression of hillock formation in thin aluminum films Electricity 13 Expired
US6657376B1 Electron emission devices and field emission display devices having buffer layer of microcrystalline silicon Electricity 9 Expired
US6461211B2 Method of forming resistor with adhesion layer for electron emission device Electricity 8 Expired
US6635983B1 Nitrogen and phosphorus doped amorphous silicon as resistor for field emission device baseplate Electricity 8 Expired
US6139385A Method of making a field emission device with silicon-containing adhesion layer Electricity 7 Expired
US5969423A Aluminum-containing films derived from using hydrogen and oxygen gas in sputter deposition Emerging Cross-Sectional Technologies 6 Expired
US6194783A Method of using hydrogen gas in sputter deposition of aluminum-containing films and aluminum-containing films derived therefrom Emerging Cross-Sectional Technologies 5 Expired
US6140701A Suppression of hillock formation in thin aluminum films Electricity 4 Expired
US6545407B1 Electron emission apparatus Electricity 3 Expired
US6222271A Method of using hydrogen gas in sputter deposition of aluminum-containing films and aluminum-containing films derived therefrom Emerging Cross-Sectional Technologies 3 Expired
US6509686B1 Field emission display cathode assembly with gate buffer layer Electricity 3 Expired
US7097526B2 Method of forming nitrogen and phosphorus doped amorphous silicon as resistor for field emission display device baseplate Electricity 3 Expired
US6425791B1 Method of making a field emission device with buffer layer Electricity 3 Expired
US6057238A Method of using hydrogen and oxygen gas in sputter deposition of aluminum-containing films and aluminum-containing films derived therefrom Emerging Cross-Sectional Technologies 3 Expired
US7161211B2 Aluminum-containing film derived from using hydrogen and oxygen gas in sputter deposition Emerging Cross-Sectional Technologies 3 Expired
US5314869A Method for forming single phase, single crystalline 2122 BCSCO superconductor thin films by liquid phase epitaxy Emerging Cross-Sectional Technologies 3 Expired
US6455939B1 Substantially hillock-free aluminum-containing components Emerging Cross-Sectional Technologies 2 Expired
US6107688A Aluminum-containing films derived from using hydrogen and oxygen gas in sputter deposition Emerging Cross-Sectional Technologies 2 Expired
US6838815B2 Field emission display with smooth aluminum film Electricity 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.