Ke Zhang
19Patents
1h-index
13Co-inventors
43Inventor score
Filing activity: Jul 6, 2017 → Feb 24, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11069868B2 | Semiconductor structure, semiconductor device, photodetector and spectrometer | Emerging Cross-Sectional Technologies | 1 | Active |
| US11320547B1 | Device and method for detecting electron beam | Physics | 1 | Active |
| US10407799B2 | Semimetal compound of Pt and method for making the same | Chemistry; Metallurgy | 1 | Active |
| US10974960B1 | Method for obtaining semiconducting carbon nanotube | Emerging Cross-Sectional Technologies | 1 | Active |
| US10138571B2 | Method for making a semimetal compound of Pt by reacting elements Pt and Te | Chemistry; Metallurgy | 0 | Active |
| US11111601B2 | Semimetal compound of Pt | Chemistry; Metallurgy | 0 | Active |
| US10280529B2 | Method for making semimetal compound of Pt | Chemistry; Metallurgy | 0 | Active |
| US11287392B2 | Method for measuring secondary electron emission coefficient | Physics | 0 | Active |
| US11709098B2 | Device and method for detecting energy beam | Electricity | 0 | Active |
| US11190132B2 | Photocurrent scanning system | Emerging Cross-Sectional Technologies | 0 | Active |
| US11479465B2 | Method for obtaining metallic carbon nanotube | Chemistry; Metallurgy | 0 | Active |
| US11996261B2 | Carbon nanotube device | Electricity | 0 | Active |
| US11874414B2 | Device and method for measuring electron beam | Electricity | 0 | Active |
| US11001937B2 | Method for making semimetal compound of Pt | Chemistry; Metallurgy | 0 | Active |
| US10132002B2 | Semimetal compound of Pt and method for making the same | Chemistry; Metallurgy | 0 | Active |
| US11824267B2 | Compact dual-band triple-polarized antenna based on shielded mushroom structures | Electricity | 0 | Active |
| US11307156B2 | Device for measuring secondary electron emission coefficient | Physics | 0 | Active |
| US11527335B2 | Electronic blackbody cavity and secondary electron detection device using the same | Electricity | 0 | Active |
| US11373841B1 | Secondary electron probe and secondary electron detector | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.