Kunihiko Iwamoto
15Patents
3h-index
14Co-inventors
53Inventor score
Filing activity: Mar 24, 2004 → Aug 6, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7387686B2 | Film formation apparatus | Electricity | 11 | Expired |
| US7482234B2 | Method of fabricating a metal oxynitride thin film that includes a first annealing of a metal oxide film in a nitrogen-containing atmosphere to form a metal oxynitride film and a second annealing of the metal oxynitride film in an oxidizing atmosphere | Electricity | 3 | Expired |
| US8207584B2 | Semiconductor device and manufacturing method of the same | Electricity | 3 | Active |
| US9082654B2 | Method of manufacturing non-volatile memory cell with simplified step of forming floating gate | Electricity | 3 | Active |
| US7372112B2 | Semiconductor device, process for producing the same and process for producing metal compound thin film | Electricity | 2 | Expired |
| US7772678B2 | Metallic compound thin film that contains high-k dielectric metal, nitrogen, and oxygen | Electricity | 2 | Active |
| US10566941B2 | Integrated circuit and method of manufacturing integrated circuit | Electricity | 1 | Active |
| US7790627B2 | Semiconductor device, method of manufacturing the same, and method of manufacturing metal compound thin film | Electricity | 1 | Active |
| US7419920B2 | Metal thin film and semiconductor comprising a metal thin film | Electricity | 1 | Active |
| US8367560B2 | Semiconductor device manufacturing method | Electricity | 1 | Active |
| US7884423B2 | Semiconductor device and fabrication method thereof | Electricity | 1 | Active |
| US10554179B2 | Differential circuit | Electricity | 0 | Active |
| US10622443B2 | Semiconductor device with different material layers in element separation portion trench and method for manufacturing semiconductor device | Electricity | 0 | Active |
| US9425203B2 | Non-volatile memory cell in semiconductor device | Electricity | 0 | Active |
| US7397094B2 | Semiconductor device and manufacturing method thereof | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.