Marc E. Levitt
16Patents
9h-index
12Co-inventors
65Inventor score
Filing activity: Jun 19, 1991 → Feb 26, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5787012A | Integrated circuit with identification signal writing circuitry distributed on multiple metal layers | Electricity | 40 | Expired |
| US5900757A | Clock stopping schemes for data buffer | Physics | 39 | Expired |
| US5341382A | Method and apparatus for improving fault coverage of system logic of an integrated circuit with embedded memory arrays | Physics | 34 | Expired |
| US5570376A | Method and apparatus for identifying faults within a system | Physics | 29 | Expired |
| US5774474A | Pipelined scan enable for fast scan testing | Physics | 24 | Expired |
| US5513186A | Method and apparatus for interconnect testing without speed degradation | Physics | 17 | Expired |
| US5898702A | Mutual exclusivity circuit for use in test pattern application scan architecture circuits | Physics | 15 | Expired |
| US5864564A | Control circuit for deterministic stopping of an integrated circuit internal clock | Physics | 14 | Expired |
| US5850150A | Final stage clock buffer in a clock distribution network | Physics | 13 | Expired |
| US6081913A | Method for ensuring mutual exclusivity of selected signals during application of test patterns | Physics | 8 | Expired |
| US5870408A | Method and apparatus for on die testing | Physics | 7 | Expired |
| US5872796A | Method for interfacing boundary-scan circuitry with linearized impedance control type output drivers | Physics | 4 | Expired |
| US5528165A | Logic signal validity verification apparatus | Physics | 4 | Expired |
| US5379303A | Maximizing improvement to fault coverage of system logic of an integrated circuit with embedded memory arrays | Physics | 3 | Expired |
| US8549339B2 | Processor core communication in multi-core processor | Emerging Cross-Sectional Technologies | 2 | Active |
| US5892778A | Boundary-scan circuit for use with linearized impedance control type output drivers | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.