Minekazu Sakai
74Patents
20h-index
72Co-inventors
91Inventor score
Filing activity: Dec 8, 1987 → Jul 7, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6255741A | Semiconductor device with a protective sheet to affix a semiconductor chip | Electricity | 94 | Expired |
| US4975390A | Method of fabricating a semiconductor pressure sensor | Emerging Cross-Sectional Technologies | 80 | Expired |
| US6065341A | Semiconductor physical quantity sensor with stopper portion | Physics | 74 | Expired |
| US6151966A | Semiconductor dynamical quantity sensor device having electrodes in Rahmen structure | Physics | 67 | Expired |
| US6240782A | Semiconductor physical quantity sensor and production method thereof | Physics | 66 | Expired |
| US6287885A | Method for manufacturing semiconductor dynamic quantity sensor | Physics | 56 | Expired |
| US6494096B2 | Semiconductor physical quantity sensor | Physics | 55 | Expired |
| US6423563B2 | Method for manufacturing semiconductor dynamic quantity sensor | Physics | 49 | Expired |
| US6276207A | Semiconductor physical quantity sensor having movable portion and fixed portion confronted each other and method of manufacturing the same | Physics | 44 | Expired |
| US6388279B1 | Semiconductor substrate manufacturing method, semiconductor pressure sensor and manufacturing method thereof | Performing Operations; Transporting | 39 | Expired |
| US6199430A | Acceleration sensor with ring-shaped movable electrode | Physics | 37 | Expired |
| US6591678B2 | Semiconductor dynamic quantity sensor for detecting dynamic quantity in two axes with X-shaped mass portion | Physics | 35 | Expired |
| US6450029B1 | Capacitive physical quantity detection device | Physics | 34 | Expired |
| US6250165A | Semiconductor physical quantity sensor | Physics | 33 | Expired |
| US5017979A | EEPROM semiconductor memory device | Electricity | 29 | Expired |
| US6508126B2 | Dynamic quantity sensor having movable and fixed electrodes with high rigidity | Physics | 28 | Expired |
| US5470771A | Method of manufacturing a floating gate memory device | Electricity | 24 | Expired |
| US6450031B1 | Semiconductor physical quantity sensor | Physics | 22 | Expired |
| US6444543B2 | Semiconductor sensor device and method of manufacturing the same | Physics | 22 | Expired |
| US7059190B2 | Semiconductor dynamic sensor having variable capacitor formed on laminated substrate | Physics | 21 | Expired |
| US5654244A | Process for producing semiconductor strain-sensitive sensor | Physics | 19 | Expired |
| US5643803A | Production method of a semiconductor dynamic sensor | Emerging Cross-Sectional Technologies | 18 | Expired |
| US5063423A | Semiconductor memory device of a floating gate tunnel oxide type | Electricity | 17 | Expired |
| US5949118A | Etching method for silicon substrates and semiconductor sensor | Emerging Cross-Sectional Technologies | 17 | Expired |
| US8225660B2 | Dynamic quantity sensor and method of manufacturing the same | Electricity | 16 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.