Nicholas Joy
15Patents
2h-index
37Co-inventors
46Inventor score
Filing activity: Apr 29, 2016 → Nov 28, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10861744B2 | Platform and method of operating for integrated end-to-end CMP-less interconnect process | Emerging Cross-Sectional Technologies | 6 | Active |
| US10903077B2 | Methods to protect nitride layers during formation of silicon germanium nano-wires in microelectronic workpieces | Electricity | 2 | Active |
| US10734278B2 | Method of protecting low-K layers | Electricity | 2 | Active |
| US10580691B2 | Method of integrated circuit fabrication with dual metal power rail | Electricity | 1 | Active |
| US9875947B2 | Method of surface profile correction using gas cluster ion beam | Electricity | 1 | Active |
| US11322364B2 | Method of patterning a metal film with improved sidewall roughness | Electricity | 1 | Active |
| US11024535B2 | Method for filling recessed features in semiconductor devices with a low-resistivity metal | Electricity | 1 | Active |
| US11133194B2 | Method for selective etching at an interface between materials | Electricity | 0 | Active |
| US12417925B2 | Method of conductive material deposition | Electricity | 0 | Active |
| US10700009B2 | Ruthenium metal feature fill for interconnects | Electricity | 0 | Active |
| US10256095B2 | Method for high throughput using beam scan size and beam position in gas cluster ion beam processing system | Electricity | 0 | Active |
| US12334391B2 | Method for patterning a substrate using photolithography | Electricity | 0 | Active |
| US11450562B2 | Method of bottom-up metallization in a recessed feature | Electricity | 0 | Active |
| US11621190B2 | Method for filling recessed features in semiconductor devices with a low-resistivity metal | Electricity | 0 | Active |
| US12057322B2 | Methods for etching metal films using plasma processing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.