Nozomu Matsuzaki
66Patents
17h-index
67Co-inventors
87Inventor score
Filing activity: Jul 13, 1990 → Aug 29, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7864568B2 | Semiconductor storage device | Physics | 216 | Active |
| US6785165B2 | Semiconductor device | Electricity | 56 | Expired |
| US6307236A | Semiconductor integrated circuit device | Emerging Cross-Sectional Technologies | 51 | Expired |
| US7057230B2 | Nonvolatile semiconductor memory device employing transistors having different gate withstand voltages for enhanced reading speed | Physics | 50 | Expired |
| US6833582B2 | Nonvolatile semiconductor memory device | Physics | 45 | Expired |
| US6461916B1 | Non-volatile semiconductor memory and method of making same, and semiconductor device and method of making the device | Electricity | 39 | Expired |
| US6972997B2 | Nonvolatile semiconductor memory device | Electricity | 34 | Expired |
| US7414283B2 | Semiconductor device | Physics | 25 | Expired |
| US6444554B1 | Method of making a non-volatile memory and semiconductor device | Electricity | 22 | Expired |
| US7700992B2 | Semiconductor device | Physics | 22 | Active |
| US8017986B2 | Semiconductor device | Physics | 22 | Active |
| US6617632B2 | Semiconductor device and a method of manufacturing the same | Electricity | 19 | Expired |
| US8054680B2 | Semiconductor device | Physics | 18 | Expired |
| US7427791B2 | Method of forming a CMOS structure having gate insulation films of different thicknesses | Emerging Cross-Sectional Technologies | 18 | Expired |
| US7667218B2 | Semiconductor integrated circuit device and method of manufacturing the same | Electricity | 17 | Expired |
| US7206216B2 | Semiconductor device with a non-erasable memory and/or a nonvolatile memory | Physics | 17 | Expired |
| US6500715B2 | Method of forming a CMOS structure having gate insulation films of different thicknesses | Emerging Cross-Sectional Technologies | 17 | Expired |
| US7130223B2 | Nonvolatile semiconductor memory device | Electricity | 15 | Expired |
| US7132718B2 | Fabrication method and structure of semiconductor non-volatile memory device | Electricity | 14 | Expired |
| US6944056B2 | Semiconductor non-volatile storage device | Electricity | 12 | Expired |
| US7528036B2 | Non-volatile semiconductor memory and method of making same, and semiconductor device and method of making device | Electricity | 11 | Expired |
| US7796426B2 | Semiconductor device | Physics | 10 | Active |
| US6657248B1 | Semiconductor device having groove isolation structure and gate oxide films with different thickness | Electricity | 10 | Expired |
| US5680066A | Signal transition detector circuit | Electricity | 9 | Expired |
| US5619151A | Semiconductor device | Electricity | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.