Inventor · New York, NY, US

Peter S. Locke

17Patents
8h-index
44Co-inventors
64Inventor score

Filing activity: Jul 30, 1999 → Mar 29, 2004

Most-cited inventions

PatentTitleAreaCited byStatus
US6270646A Electroplating apparatus and method using a compressible contact Chemistry; Metallurgy 50 Expired
US6333120A Method for controlling the texture and microstructure of plated copper and plated structure Emerging Cross-Sectional Technologies 36 Expired
US6627052B2 Electroplating apparatus with vertical electrical contact Chemistry; Metallurgy 30 Expired
US6344129B1 Method for plating copper conductors and devices formed Electricity 29 Expired
US6368484B1 Selective plating process Electricity 29 Expired
US6471845B1 Method of controlling chemical bath composition in a manufacturing environment Emerging Cross-Sectional Technologies 26 Expired
US6344125B1 Pattern-sensitive electrolytic metal plating Electricity 22 Expired
US6413854B1 Method to build multi level structure Electricity 22 Expired
US6331237A Method of improving contact reliability for electroplating Chemistry; Metallurgy 4 Expired
US6258717A Method to produce high quality metal fill in deep submicron vias and lines Emerging Cross-Sectional Technologies 3 Expired
US6592747B2 Method of controlling additives in copper plating baths Physics 3 Expired
US6660330B2 Method for depositing metal films onto substrate surfaces utilizing a chamfered ring support Electricity 3 Expired
US6979393B2 Method for plating copper conductors and devices formed Electricity 0 Expired
US7678258B2 Void-free damascene copper deposition process and means of monitoring thereof Chemistry; Metallurgy 0 Active
US7078247B2 Early detection of contact liner integrity by chemical reaction Emerging Cross-Sectional Technologies 0 Expired
US7227265B2 Electroplated copper interconnection structure, process for making and electroplating bath Chemistry; Metallurgy 0 Expired
US6600230B2 Seedlayer for plating metal in deep submicron structures Emerging Cross-Sectional Technologies 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.