Scott C. Blackstone
14Patents
10h-index
12Co-inventors
69Inventor score
Filing activity: Jul 20, 1981 → Feb 25, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4578142A | Method for growing monocrystalline silicon through mask layer | Emerging Cross-Sectional Technologies | 69 | Expired |
| US4549926A | Method for growing monocrystalline silicon on a mask layer | Emerging Cross-Sectional Technologies | 42 | Expired |
| US5004705A | Inverted epitaxial process | Emerging Cross-Sectional Technologies | 37 | Expired |
| US5098861A | Method of processing a semiconductor substrate including silicide bonding | Emerging Cross-Sectional Technologies | 34 | Expired |
| US5416354A | Inverted epitaxial process semiconductor devices | Electricity | 33 | Expired |
| US4582559A | Method of making thin free standing single crystal films | Emerging Cross-Sectional Technologies | 26 | Expired |
| US4402128A | Method of forming closely spaced lines or contacts in semiconductor devices | Emerging Cross-Sectional Technologies | 20 | Expired |
| US5164813A | New diode structure | Electricity | 18 | Expired |
| US4586240A | Vertical IGFET with internal gate and method for making same | Emerging Cross-Sectional Technologies | 17 | Expired |
| US4546375A | Vertical IGFET with internal gate and method for making same | Emerging Cross-Sectional Technologies | 11 | Expired |
| US4526665A | Method of depositing fully reacted titanium disilicide thin films | Electricity | 8 | Expired |
| US6723579B2 | Semiconductor wafer comprising micro-machined components and a method for fabricating the semiconductor wafer | Performing Operations; Transporting | 0 | Expired |
| US6797591B1 | Method for forming a semiconductor device and a semiconductor device formed by the method | Electricity | 0 | Expired |
| US7045869B2 | Semiconductor wafer comprising micro-machined components | Performing Operations; Transporting | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.