Shem Ogadhoh
18Patents
3h-index
45Co-inventors
56Inventor score
Filing activity: Oct 29, 2004 → Oct 17, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7470492B2 | Process window-based correction for photolithography masks | Physics | 9 | Active |
| US8404403B2 | Mask design and OPC for device manufacture | Physics | 8 | Active |
| US8399157B2 | Lithography mask having sub-resolution phased assist features | Physics | 3 | Active |
| US8778605B2 | Mask design and OPC for device manufacture | Physics | 2 | Active |
| US8959465B2 | Techniques for phase tuning for process optimization | Physics | 1 | Active |
| US11121073B2 | Through plate interconnect for a vertical MIM capacitor | Electricity | 1 | Active |
| US11610894B2 | Capacitor separations in dielectric layers | Electricity | 0 | Active |
| US11581162B2 | Fill pattern to enhance ebeam process margin | Electricity | 0 | Active |
| US11107658B2 | Fill pattern to enhance e-beam process margin | Electricity | 0 | Active |
| US11404536B2 | Thin-film transistor structures with gas spacer | Electricity | 0 | Active |
| US12426247B2 | Capacitor connections in dielectric layers | Electricity | 0 | Active |
| US12176284B2 | Through plate interconnect for a vertical MIM capacitor | Electricity | 0 | Active |
| US9046761B2 | Lithography mask having sub-resolution phased assist features | Physics | 0 | Active |
| US11652047B2 | Intermediate separation layers at the back-end-of-line | Electricity | 0 | Active |
| US11832438B2 | Capacitor connections in dielectric layers | Electricity | 0 | Active |
| US11563107B2 | Method of contact patterning of thin film transistors for embedded DRAM using a multi-layer hardmask | Electricity | 0 | Active |
| US11991873B2 | Capacitor separations in dielectric layers | Electricity | 0 | Active |
| US12080643B2 | Integrated circuit structures having differentiated interconnect lines in a same dielectric layer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.