Inventor · Hsinchu, TW

Shih-Che Wang

17Patents
2h-index
48Co-inventors
54Inventor score

Filing activity: Nov 13, 1998 → Mar 13, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US6420791B1 Alignment mark design Emerging Cross-Sectional Technologies 55 Expired
US6080659A Method to form an alignment mark Electricity 12 Expired
US8416393B2 Cross quadrupole double lithography method and apparatus for semiconductor device fabrication using two apertures Electricity 2 Active
US7838173B2 Structure design and fabrication on photomask for contact hole manufacturing process window enhancement Physics 2 Active
US10558120B2 System and method for supplying and dispensing bubble-free photolithography chemical solutions Emerging Cross-Sectional Technologies 2 Active
US10795270B2 Methods of defect inspection Electricity 1 Active
US7338909B2 Micro-etching method to replicate alignment marks for semiconductor wafer photolithography Electricity 1 Expired
US12001132B2 Protection layer on low thermal expansion material (LTEM) substrate of extreme ultraviolet (EUV) mask Electricity 1 Active
US11624985B2 Methods of defect inspection Electricity 0 Active
US9817315B2 System and method for supplying and dispensing bubble-free photolithography chemical solutions Emerging Cross-Sectional Technologies 0 Active
US11798800B2 Method and apparatus for solvent recycling Electricity 0 Active
US12025917B2 System and method for supplying and dispensing bubble-free photolithography chemical solutions Emerging Cross-Sectional Technologies 0 Active
US9280041B2 Cross quadrupole double lithography method using two complementary apertures Electricity 0 Active
US11545361B2 Method and apparatus for coating photo resist over a substrate Electricity 0 Active
US12362179B2 Method and apparatus for coating photo resist over a substrate Electricity 0 Active
US10274818B2 Lithography patterning with sub-resolution assistant patterns and off-axis illumination Physics 0 Active
US11955335B2 Method and apparatus for coating photo resist over a substrate Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.