Inventor · Shelburne, VT, US

Stuart E. Greer

14Patents
13h-index
21Co-inventors
78Inventor score

Filing activity: Jun 23, 1978 → Jan 18, 2002

Most-cited inventions

PatentTitleAreaCited byStatus
US5470787A Semiconductor device solder bump having intrinsic potential for forming an extended eutectic region and method for making and using the same Electricity 177 Expired
US6346469B1 Semiconductor device and a process for forming the semiconductor device Electricity 138 Expired
US5468655A Method for forming a temporary attachment between a semiconductor die and a substrate using a metal paste comprising spherical modules Emerging Cross-Sectional Technologies 125 Expired
US6107180A Method for forming interconnect bumps on a semiconductor die Emerging Cross-Sectional Technologies 109 Expired
US6451681B1 Method of forming copper interconnection utilizing aluminum capping film Electricity 80 Expired
US6713381B2 Method of forming semiconductor device including interconnect barrier layers Electricity 73 Expired
US4202007A Multi-layer dielectric planar structure having an internal conductor pattern characterized with opposite terminations disposed at a common edge surface of the layers Electricity 71 Expired
US4602271A Personalizable masterslice substrate for semiconductor chips Electricity 53 Expired
US5597737A Method for testing and burning-in a semiconductor wafer Physics 39 Expired
US6689680B2 Semiconductor device and method of formation Electricity 22 Expired
US5104695A Method and apparatus for vapor deposition of material onto a substrate Chemistry; Metallurgy 22 Expired
US4861425A Lift-off process for terminal metals Emerging Cross-Sectional Technologies 18 Expired
US6117759A Method for multiplexed joining of solder bumps to various substrates during assembly of an integrated circuit package Electricity 14 Expired
US4598470A Method for providing improved electrical and mechanical connection between I/O pin and transverse via substrate Emerging Cross-Sectional Technologies 12 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.