Tetsuji Yamaguchi
186Patents
15h-index
162Co-inventors
89Inventor score
Filing activity: Oct 11, 1990 → Mar 29, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7745293B2 | Method for manufacturing a thin film transistor including forming impurity regions by diagonal doping | Electricity | 109 | Expired |
| US7504663B2 | Semiconductor device with a floating gate electrode that includes a plurality of particles | Electricity | 35 | Expired |
| US5282355A | Exhaust gas NO.sub.x removal system | Performing Operations; Transporting | 29 | Expired |
| US7323368B2 | Method for manufacturing semiconductor device and heat treatment method | Electricity | 29 | Expired |
| US7521368B2 | Method for manufacturing semiconductor device | Electricity | 25 | Expired |
| US7170176B2 | Semiconductor device | Electricity | 25 | Expired |
| US5134463A | Stress relief layer providing high thermal conduction for a semiconductor device | Electricity | 22 | Expired |
| US8183603B2 | Solid-state imaging device for inhibiting dark current | Electricity | 22 | Active |
| US8368784B2 | Solid-state imaging device, method of manufacturing the same, and electronic apparatus | Electricity | 21 | Active |
| US7192859B2 | Method of manufacturing semiconductor device and display device | Physics | 16 | Expired |
| US8728852B2 | Solid-state imaging device, production method thereof, and electronic device | Electricity | 16 | Active |
| US7098087B2 | Manufacturing method of semiconductor device | Electricity | 16 | Expired |
| US6191853A | Apparatus for measuring particle size distribution and method for analyzing particle size distribution | Physics | 15 | Expired |
| US5278413A | Infrared microscopic spectrometer | Physics | 15 | Expired |
| US7288480B2 | Thin film integrated circuit and method for manufacturing the same, CPU, memory, electronic card and electronic device | Electricity | 15 | Expired |
| US7524709B2 | Manufacturing method for a display device | Electricity | 14 | Active |
| US8450728B2 | Solid-state imaging device, method of manufacturing the same, and electronic apparatus | Electricity | 13 | Active |
| US9064762B2 | Solid-state imaging device, method for manufacturing solid-state imaging device, and imaging apparatus | Electricity | 13 | Active |
| US9018688B2 | Solid-state imaging device and imaging apparatus | Emerging Cross-Sectional Technologies | 12 | Active |
| US7335556B2 | Manufacturing method of semiconductor device | Electricity | 10 | Expired |
| US8704924B2 | Solid-state imaging device with a photoelectric conversion element, and method thereof | Electricity | 10 | Active |
| US9426399B2 | Solid-state imaging device, method of manufacturing the same, and electronic apparatus | Electricity | 9 | Active |
| US8907262B2 | Solid state imaging device and electronic apparatus having a photoelectric conversion film outside of a semiconductor substrate and dual charge accumulation unit | Emerging Cross-Sectional Technologies | 9 | Active |
| US7211502B2 | Method for manufacturing semiconductor device | Electricity | 9 | Expired |
| US8471314B2 | Solid-state imaging device, method for producing same, and camera | Electricity | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.