Walter H. Johnson
20Patents
9h-index
42Co-inventors
75Inventor score
Filing activity: Jun 11, 1992 → Oct 19, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7302316B2 | Programmable autopilot system for autonomous flight of unmanned aerial vehicles | Performing Operations; Transporting | 104 | Expired |
| US6707540B1 | In-situ metalization monitoring using eddy current and optical measurements | Physics | 95 | Expired |
| US6433541B1 | In-situ metalization monitoring using eddy current measurements during the process for removing the film | Physics | 92 | Expired |
| US6621264B1 | In-situ metalization monitoring using eddy current measurements during the process for removing the film | Physics | 37 | Expired |
| US5552704A | Eddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected curves | Electricity | 33 | Expired |
| US5260668A | Semiconductor surface resistivity probe with semiconductor temperature control | Physics | 23 | Expired |
| US6815959B2 | Systems and methods for measuring properties of conductive layers | Physics | 12 | Expired |
| US7070476B2 | In-situ metalization monitoring using eddy current measurements during the process for removing the film | Physics | 11 | Expired |
| US6885190B2 | In-situ metalization monitoring using eddy current measurements during the process for removing the film | Physics | 9 | Expired |
| US7050160B1 | Process and apparatus for integrating sheet resistance measurements and reflectance measurements of a thin film in a common apparatus | Physics | 4 | Expired |
| US9778043B1 | Aided INS microchip assemblies and related methods | Electricity | 2 | Active |
| US10231337B2 | Folded printed circuit assemblies and related methods | Electricity | 1 | Active |
| US10514391B2 | Resistivity probe having movable needle bodies | Physics | 1 | Active |
| US10598477B2 | Dynamic determination of metal film thickness from sheet resistance and TCR value | Physics | 0 | Active |
| US11249110B2 | Resistivity probes with curved portions | Physics | 0 | Active |
| US9435826B2 | Variable spacing four-point probe pin device and method | Physics | 0 | Active |
| US11043239B2 | Magneto-optic Kerr effect metrology systems | Physics | 0 | Active |
| US10663279B2 | Dynamic determination of metal film thickness from sheet resistance and TCR value | Physics | 0 | Active |
| US12164093B2 | Reflective compact lens for magneto-optic Kerr effect metrology system | Physics | 0 | Active |
| US9030219B2 | Variable pressure four-point coated probe pin device and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.