Yoshihiro Notani
15Patents
10h-index
19Co-inventors
65Inventor score
Filing activity: Aug 11, 1992 → Oct 3, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5294897A | Microwave IC package | Emerging Cross-Sectional Technologies | 309 | Expired |
| US5426399A | Film carrier signal transmission line having separating grooves | Electricity | 82 | Expired |
| US5418329A | High frequency IC package | Emerging Cross-Sectional Technologies | 49 | Expired |
| US5675184A | Integrated circuit device | Electricity | 48 | Expired |
| US6570390B2 | Method for measuring surface leakage current of sample | Physics | 41 | Expired |
| US5302554A | Method for producing semiconductor device | Emerging Cross-Sectional Technologies | 31 | Expired |
| US5977631A | Semiconductor device including a semiconductor package with electromagnetic coupling slots | Electricity | 25 | Expired |
| US5349317A | High frequency signal transmission tape | Electricity | 17 | Expired |
| US5808519A | Hermetically sealed millimeter-wave device | Electricity | 17 | Expired |
| US5426319A | High-frequency semiconductor device including microstrip transmission line | Electricity | 14 | Expired |
| US5767569A | Tab tape and semiconductor chip mounted on tab tape | Electricity | 5 | Expired |
| US5786627A | Integrated circuit device and fabricating thereof | Electricity | 3 | Expired |
| US6791335B2 | Sample assembly for thermoelectric analyzer | Physics | 2 | Expired |
| US7622930B2 | Method for inspecting transmission line characteristic of a semiconductor device using signal reflection measurement | Physics | 0 | Active |
| US7321170B2 | High frequency semiconductor device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.