FormFactor Beaverton, Inc.
17Patents
17Active
17Granted
51Portfolio score
Filing activity: Feb 18, 2015 → Dec 30, 2019
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10330703B2 | Probe systems and methods including electric contact detection | Physics | 3 | Active |
| US10062597B2 | High voltage chuck for a probe station | Emerging Cross-Sectional Technologies | 2 | Active |
| US10459006B2 | Probe systems and methods | Physics | 2 | Active |
| US10809048B2 | Probe systems and methods for calibrating capacitive height sensing measurements | Physics | 2 | Active |
| US10365323B2 | Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change | Physics | 1 | Active |
| US10060963B2 | Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges | Physics | 1 | Active |
| US10281518B2 | Systems and methods for on-wafer dynamic testing of electronic devices | Physics | 1 | Active |
| US10877070B2 | Probes with fiducial targets, probe systems including the same, and associated methods | Electricity | 1 | Active |
| US10060950B2 | Shielded probe systems | Physics | 1 | Active |
| US10571487B2 | Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test | Physics | 1 | Active |
| US10180486B2 | Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods | Electricity | 1 | Active |
| US10698002B2 | Probe systems for testing a device under test | Electricity | 0 | Active |
| US10120020B2 | Probe head assemblies and probe systems for testing integrated circuit devices | Physics | 0 | Active |
| US10698025B2 | Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test | Physics | 0 | Active |
| US10267848B2 | Method of electrically contacting a bond pad of a device under test with a probe | Emerging Cross-Sectional Technologies | 0 | Active |
| US10281492B2 | Shielded probe systems with controlled testing environments | Physics | 0 | Active |
| US10161994B2 | Systems and methods for electrically testing electromigration in an electromigration test structure | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.