Micron Quantum Devices, Inc.
55Patents
0Active
55Granted
38Portfolio score
Filing activity: Feb 10, 1995 → Aug 26, 1997
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5754567A | Write reduction in flash memory systems through ECC usage | Physics | 212 | Expired |
| US5715193A | Flash memory system and method for monitoring the disturb effect on memory cell blocks due to high voltage conditions of other memory cell blocks | Physics | 185 | Expired |
| US5675540A | Non-volatile memory system having internal data verification test mode | Physics | 132 | Expired |
| US5581206A | Power level detection circuit | Electricity | 128 | Expired |
| US5627784A | Memory system having non-volatile data storage structure for memory control parameters and method | Physics | 124 | Expired |
| US5615159A | Memory system with non-volatile data storage unit and method of initializing same | Physics | 106 | Expired |
| US5526364A | Apparatus for entering and executing test mode operations for memory | Physics | 83 | Expired |
| US5677885A | Memory system with non-volatile data storage unit and method of initializing same | Physics | 82 | Expired |
| US5771346A | Apparatus and method for detecting over-programming condition in multistate memory device | Physics | 77 | Expired |
| US5723990A | Integrated circuit having high voltage detection circuit | Electricity | 73 | Expired |
| US5768287A | Apparatus and method for programming multistate memory device | Physics | 65 | Expired |
| US5594694A | Memory circuit with switch for selectively connecting an input/output pad directly to a nonvolatile memory cell | Physics | 63 | Expired |
| US5619461A | Memory system having internal state monitoring circuit | Physics | 50 | Expired |
| US5568426A | Method and apparatus for performing memory cell verification on a nonvolatile memory circuit | Physics | 48 | Expired |
| US5790453A | Apparatus and method for reading state of multistate non-volatile memory cells | Physics | 46 | Expired |
| US5682345A | Non-volatile data storage unit method of controlling same | Physics | 45 | Expired |
| US5781477A | Flash memory system having fast erase operation | Physics | 44 | Expired |
| US5764568A | Method for performing analog over-program and under-program detection for a multistate memory cell | Physics | 43 | Expired |
| US5619453A | Memory system having programmable flow control register | Physics | 42 | Expired |
| US5636166A | Apparatus for externally timing high voltage cycles of non-volatile memory system | Physics | 37 | Expired |
| US5721702A | Reference voltage generator using flash memory cells | Physics | 35 | Expired |
| US5673224A | Segmented non-volatile memory array with multiple sources with improved word line control circuitry | Electricity | 33 | Expired |
| US5661690A | Circuit and method for performing tests on memory array cells using external sense amplifier reference current | Physics | 28 | Expired |
| US5694366A | OP amp circuit with variable resistance and memory system including same | Electricity | 26 | Expired |
| US5677879A | Method and apparatus for performing memory cell verification on a nonvolatile memory circuit | Physics | 25 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.