Patent assignee · SG · COMPANY

Siliconix Technology C. V.

22Patents
18Active
22Granted
44Portfolio score

Filing activity: Feb 25, 2004 → Mar 20, 2015 · 13 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US8368165B2 Silicon carbide Schottky diode Electricity 20 Active
US7834376B2 Power semiconductor switch Electricity 15 Expired
US7767500B2 Superjunction device with improved ruggedness Electricity 14 Active
US7492003B2 Superjunction power semiconductor device Electricity 14 Active
US7292445B2 Active integrated rectifier regulator Emerging Cross-Sectional Technologies 14 Expired
US7394158B2 Solderable top metal for SiC device Electricity 13 Expired
US7858456B2 Merged P-i-N Schottky structure Electricity 10 Expired
US7659588B2 Termination for a superjunction device Electricity 8 Active
US9478441B1 Method for forming a superjunction device with improved ruggedness Electricity 7 Active
US8633561B2 Termination for a superjunction device Electricity 7 Active
US7812441B2 Schottky diode with improved surge capability Electricity 6 Active
US7749877B2 Process for forming Schottky rectifier with PtNi silicide Schottky barrier Electricity 5 Active
US9472403B2 Power semiconductor switch with plurality of trenches Electricity 4 Active
US9496421B2 Solderable top metal for silicon carbide semiconductor devices Electricity 2 Active
US9627553B2 Silicon carbide schottky diode Electricity 1 Active
US8895424B2 Process for forming schottky rectifier with PtNi silicide schottky barrier Electricity 1 Active
US9935193B2 MOSFET termination trench Electricity 0 Active
US7808029B2 Mask structure for manufacture of trench type semiconductor device Electricity 0 Active
US8274128B2 Semiconductor device with buffer layer Electricity 0 Active
US8685849B2 Semiconductor device with buffer layer Electricity 0 Active
US8921969B2 Chip-scale Schottky device Electricity 0 Active
US9865749B1 Merged P-i-N Schottky structure Electricity 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.