Inventor · Dresden, DE

Casey Scott

13Patents

4h-index

13Co-inventors

49Inventor score

Filing activity: Jul 17, 2007 → May 18, 2012

Most-cited inventions

Patent	Title	Area	Cited by	Status
US7811876B2	Reduction of memory instability by local adaptation of re-crystallization conditions in a cache area of a semiconductor device	Electricity	9	Active
US8212184B2	Cold temperature control in a semiconductor device	Electricity	9	Active
US8093634B2	In situ formed drain and source regions in a silicon/germanium containing transistor device	Electricity	7	Active
US8183100B2	Transistor with embedded SI/GE material having enhanced across-substrate uniformity	Electricity	4	Active
US8138050B2	Transistor device comprising an asymmetric embedded semiconductor alloy	Electricity	4	Active
US7713763B2	Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions	Electricity	3	Active
US8227266B2	Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions	Electricity	3	Active
US8373244B2	Temperature monitoring in a semiconductor device by thermocouples distributed in the contact structure	Electricity	2	Active
US9450073B2	SOI transistor having drain and source regions of reduced length and a stressed dielectric material adjacent thereto	Electricity	2	Active
US7897451B2	Method for creating tensile strain by selectively applying stress memorization techniques to NMOS transistors	Electricity	1	Active
US8530894B2	Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions	Electricity	0	Active
US8652913B2	Method for forming silicon/germanium containing drain/source regions in transistors with reduced silicon/germanium loss	Electricity	0	Active
US8334569B2	Transistor with embedded Si/Ge material having enhanced across-substrate uniformity	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.