Darsen D. Lu
40Patents
5h-index
23Co-inventors
65Inventor score
Filing activity: Mar 12, 2013 → Dec 22, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9525027B2 | Lateral bipolar junction transistor having graded SiGe base | Electricity | 11 | Active |
| US9786737B2 | FinFET with reduced parasitic capacitance | Electricity | 8 | Active |
| US9548386B1 | Structure and method for compressively strained silicon germanium fins for pFET devices and tensily strained silicon fins for nFET devices | Electricity | 7 | Active |
| US9455250B1 | Distributed decoupling capacitor | Electricity | 7 | Active |
| US9583492B2 | Structure and method for advanced bulk fin isolation | Electricity | 5 | Active |
| US9299618B1 | Structure and method for advanced bulk fin isolation | Electricity | 5 | Active |
| US9653541B2 | Structure and method to make strained FinFET with improved junction capacitance and low leakage | Electricity | 3 | Active |
| US9543323B2 | Strain release in PFET regions | Electricity | 2 | Active |
| US9583624B1 | Asymmetric finFET memory access transistor | Electricity | 2 | Active |
| US9362400B1 | Semiconductor device including dielectrically isolated finFETs and buried stressor | Electricity | 2 | Active |
| US9553173B1 | Asymmetric finFET memory access transistor | Electricity | 2 | Active |
| US9276113B2 | Structure and method to make strained FinFET with improved junction capacitance and low leakage | Electricity | 1 | Active |
| US10177223B2 | FinFET with reduced parasitic capacitance | Electricity | 1 | Active |
| US10243042B2 | FinFET with reduced parasitic capacitance | Electricity | 1 | Active |
| US9954083B2 | Semiconductor structures having increased channel strain using fin release in gate regions | Electricity | 1 | Active |
| US9515171B1 | Radiation tolerant device structure | Electricity | 1 | Active |
| US10056474B2 | Semiconductor structures having increased channel strain using fin release in gate regions | Electricity | 1 | Active |
| US9034715B2 | Method and structure for dielectric isolation in a fin field effect transistor | Electricity | 1 | Active |
| US10892364B2 | Dielectric isolated fin with improved fin profile | Electricity | 0 | Active |
| US9564439B2 | Structure and method for advanced bulk fin isolation | Electricity | 0 | Active |
| US10262991B2 | Distributed decoupling capacitor | Electricity | 0 | Active |
| US9209065B1 | Engineered substrate and device for co-integration of strained silicon and relaxed silicon | Electricity | 0 | Active |
| US10347752B2 | Semiconductor structures having increased channel strain using fin release in gate regions | Electricity | 0 | Active |
| US10593663B2 | Distributed decoupling capacitor | Electricity | 0 | Active |
| US10734477B2 | FinFET with reduced parasitic capacitance | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.