David L. Brown
52Patents
11h-index
51Co-inventors
81Inventor score
Filing activity: Jun 30, 1998 → Sep 5, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6137570A | System and method for analyzing topological features on a surface | Physics | 96 | Expired |
| US7609309B2 | Continuous clocking of TDI sensors | Electricity | 67 | Active |
| US7528943B2 | Method and apparatus for simultaneous high-speed acquisition of multiple images | Physics | 66 | Active |
| US7952633B2 | Apparatus for continuous clocking of TDI sensors | Electricity | 55 | Active |
| US7136159B2 | Excimer laser inspection system | Physics | 46 | Expired |
| US9426400B2 | Method and apparatus for high speed acquisition of moving images using pulsed illumination | Electricity | 29 | Active |
| US9496425B2 | Back-illuminated sensor with boron layer | Electricity | 22 | Active |
| US9478402B2 | Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor | Electricity | 19 | Active |
| US8754972B2 | Integrated multi-channel analog front end and digitizer for high speed imaging applications | Electricity | 16 | Active |
| US9748294B2 | Anti-reflection layer for back-illuminated sensor | Electricity | 13 | Active |
| US8624971B2 | TDI sensor modules with localized driving and signal processing circuitry for high speed inspection | Electricity | 13 | Active |
| US9439050B2 | Wireless electronic device configuration system | Electricity | 10 | Active |
| US9767986B2 | Scanning electron microscope and methods of inspecting and reviewing samples | Electricity | 9 | Active |
| US10197501B2 | Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors | Electricity | 9 | Active |
| US7728968B2 | Excimer laser inspection system | Physics | 6 | Active |
| US7126100B1 | System and method for sensing using adjustable modulation transfer function (MTF) | Electricity | 5 | Expired |
| US11187223B2 | Home flood prevention appliance system | Mechanical Engineering; Lighting; Heating | 5 | Active |
| US9818887B2 | Back-illuminated sensor with boron layer | Electricity | 5 | Active |
| US9077862B2 | TDI sensor modules with localized driving and signal processing circuitry for high speed inspection | Electricity | 4 | Active |
| US10121914B2 | Back-illuminated sensor with boron layer | Electricity | 4 | Active |
| US9793673B2 | Semiconductor inspection and metrology system using laser pulse multiplier | Physics | 4 | Active |
| US7465913B2 | System and method for sensing using adjustable modulation transfer function (MTF) with voltage variations relative to depletion depth at a pixel | Electricity | 4 | Active |
| US7714300B1 | High-speed high-efficiency solid-state electron detector | Electricity | 4 | Active |
| US8748828B2 | Interposer based imaging sensor for high-speed image acquisition and inspection systems | Emerging Cross-Sectional Technologies | 4 | Active |
| US10269842B2 | Anti-reflection layer for back-illuminated sensor | Electricity | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.