Inventor · Fremont, CA, US

David Mui

68Patents
17h-index
86Co-inventors
87Inventor score

Filing activity: Nov 12, 1997 → Mar 26, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US6699399B1 Self-cleaning etch process Emerging Cross-Sectional Technologies 458 Expired
US6924191B2 Method for fabricating a gate structure of a field effect transistor Electricity 409 Expired
US6235643A Method for etching a trench having rounded top and bottom corners in a silicon substrate Electricity 270 Expired
US6677242B1 Integrated shallow trench isolation approach Electricity 236 Expired
US6136211A Self-cleaning etch process Emerging Cross-Sectional Technologies 94 Expired
US7779232B2 Method and apparatus for dynamically managing instruction buffer depths for non-predicted branches Physics 62 Active
US6317811A Method and system for reissuing load requests in a multi-stream prefetch design Physics 58 Expired
US6960416B2 Method and apparatus for controlling etch processes during fabrication of semiconductor devices Electricity 46 Expired
US9069563B2 Reducing store-hit-loads in an out-of-order processor Physics 32 Active
US6180533A Method for etching a trench having rounded top corners in a silicon substrate Electricity 31 Expired
US6037265A Etchant gas and a method for etching transistor gates Electricity 29 Expired
US6449698B1 Method and system for bypass prefetch data path Physics 27 Expired
US6484220B1 Transfer of data between processors in a multi-processor system Physics 22 Expired
US7094613B2 Method for controlling accuracy and repeatability of an etch process Electricity 21 Expired
US6911399B2 Method of controlling critical dimension microloading of photoresist trimming process by selective sidewall polymer deposition Electricity 20 Expired
US8617993B2 Method of reducing pattern collapse in high aspect ratio nanostructures Electricity 20 Active
US6858361B2 Methodology for repeatable post etch CD in a production tool Electricity 19 Expired
US8943299B2 Operating a stack of information in an information handling system Physics 17 Active
US6458671B1 Method of providing a shallow trench in a deep-trench device Electricity 14 Expired
US6134684A Method and system for error detection in test units utilizing pseudo-random data Physics 14 Expired
US6566270B1 Integration of silicon etch and chamber cleaning processes Electricity 12 Expired
US6924088B2 Method and system for realtime CD microloading control Emerging Cross-Sectional Technologies 11 Expired
US7498106B2 Method and apparatus for controlling etch processes during fabrication of semiconductor devices Electricity 10 Active
US6632321B2 Method and apparatus for monitoring and controlling wafer fabrication process Electricity 9 Expired
US8227394B2 Composition of a cleaning material for particle removal Chemistry; Metallurgy 9 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.