Deepak A. Ramappa
47Patents
6h-index
47Co-inventors
69Inventor score
Filing activity: Sep 28, 2001 → Feb 1, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7443189B2 | Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit | Physics | 79 | Expired |
| US6607927B2 | Method and apparatus for monitoring in-line copper contamination | Electricity | 31 | Expired |
| US6869873B2 | Copper silicide passivation for improved reliability | Electricity | 16 | Expired |
| US7767583B2 | Method to improve uniformity of chemical mechanical polishing planarization | Electricity | 14 | Active |
| US7772867B2 | Structures for testing and locating defects in integrated circuits | Electricity | 9 | Active |
| US8153496B1 | Self-aligned process and method for fabrication of high efficiency solar cells | Emerging Cross-Sectional Technologies | 7 | Active |
| US8815634B2 | Dark currents and reducing defects in image sensors and photovoltaic junctions | Emerging Cross-Sectional Technologies | 6 | Active |
| US7868306B2 | Thermal modulation of implant process | Electricity | 6 | Active |
| US6812050B1 | System and method of evaluating gate oxide integrity for semiconductor microchips | Physics | 5 | Expired |
| US7268073B2 | Post-polish treatment for inhibiting copper corrosion | Electricity | 5 | Expired |
| US8614143B2 | Simultaneous via and trench patterning using different etch rates | Electricity | 5 | Active |
| US7200498B2 | System for remediating cross contamination in semiconductor manufacturing processes | Emerging Cross-Sectional Technologies | 5 | Expired |
| US10131757B2 | Methods for surface modification of materials | Chemistry; Metallurgy | 4 | Active |
| US7601629B2 | Semiconductive device fabricated using subliming materials to form interlevel dielectrics | Electricity | 4 | Expired |
| US8507298B2 | Patterned implant of a dielectric layer | Emerging Cross-Sectional Technologies | 4 | Active |
| US8187979B2 | Workpiece patterning with plasma sheath modulation | Emerging Cross-Sectional Technologies | 3 | Active |
| US8603900B2 | Reducing surface recombination and enhancing light trapping in solar cells | Emerging Cross-Sectional Technologies | 3 | Active |
| US7228193B2 | Methods for detecting structure dependent process defects | Physics | 3 | Expired |
| US8937004B2 | Apparatus and method for controllably implanting workpieces | Emerging Cross-Sectional Technologies | 2 | Active |
| US7312151B2 | System for ultraviolet atmospheric seed layer remediation | Electricity | 2 | Expired |
| US8461032B2 | Use of dopants with different diffusivities for solar cell manufacture | Emerging Cross-Sectional Technologies | 2 | Active |
| US8716155B2 | Method to enhance charge trapping | Electricity | 2 | Active |
| US8465909B2 | Self-aligned masking for solar cell manufacture | Emerging Cross-Sectional Technologies | 2 | Active |
| US8283265B2 | Method to enhance charge trapping | Electricity | 2 | Active |
| US7902091B2 | Cleaving of substrates | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.