Inventor · Tokyo, JP

Hidemitsu Aoki

70Patents
19h-index
52Co-inventors
83Inventor score

Filing activity: Mar 23, 1995 → Nov 24, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US5635053A Method and apparatus for cleaning electronic parts Emerging Cross-Sectional Technologies 59 Expired
US5676760A Method for wet processing of a semiconductor substrate Chemistry; Metallurgy 53 Expired
US6423148B1 Substrate-cleaning method and substrate-cleaning solution Emerging Cross-Sectional Technologies 49 Expired
US5762779A Method for producing electrolyzed water Chemistry; Metallurgy 45 Expired
US5616221A Electrolytic ionized water producing apparatus Emerging Cross-Sectional Technologies 40 Expired
US5543030A Method for producing electrolyzed water Chemistry; Metallurgy 36 Expired
US6225217A Method of manufacturing semiconductor device having multilayer wiring Electricity 35 Expired
US5578193A Method and apparatus for wet treatment of solid surfaces Emerging Cross-Sectional Technologies 34 Expired
US6869921B2 Stripping composition Chemistry; Metallurgy 32 Expired
US5833831A Method and system for generating electrolyzed water Electricity 30 Expired
US6683007B1 Etching and cleaning methods and etching and cleaning apparatus used therefor Electricity 29 Expired
US5599438A Method for producing electrolyzed water Chemistry; Metallurgy 28 Expired
US6787480B2 Manufacturing method of semicondcutor device Electricity 27 Expired
US6080709A Cleaning solution for cleaning substrates to which a metallic wiring has been applied Electricity 22 Expired
US5989919A Method for analyzing contamination within hole in semiconductor device Physics 22 Expired
US6387190B1 Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring Electricity 21 Expired
US6319801A Method for cleaning a substrate and cleaning solution Emerging Cross-Sectional Technologies 21 Expired
US6890391B2 Method of manufacturing semiconductor device and apparatus for cleaning substrate Emerging Cross-Sectional Technologies 19 Expired
US6465352B1 Method for removing dry-etching residue in a semiconductor device fabricating process Electricity 19 Expired
US7312186B2 Cleaning solution for semiconductor substrate Chemistry; Metallurgy 18 Expired
US6036581A Substrate cleaning method and apparatus Electricity 17 Expired
US6524376B2 Anticorrosive agent Electricity 15 Expired
US6592677B1 Method of forming a semiconductor device by simultaneously cleaning both sides of a wafer using different cleaning solutions Electricity 14 Expired
US6964724B2 Etching and cleaning methods and etching and cleaning apparatuses used therefor Electricity 13 Expired
US6444583B2 Substrate-cleaning method and substrate-cleaning solution Emerging Cross-Sectional Technologies 13 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.