Hideyuki Aoki
35Patents
10h-index
52Co-inventors
78Inventor score
Filing activity: Feb 26, 1986 → Jan 21, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7200394B2 | Information distribution service system based on predicted changes in location of mobile information terminal | Electricity | 77 | Expired |
| US4711138A | Automatic transmission mechanism | Mechanical Engineering; Lighting; Heating | 34 | Expired |
| US6222406A | Semiconductor integrated circuit device, semiconductor memory system and clock synchronous circuit | Electricity | 28 | Expired |
| US4722242A | Automatic transmission | Emerging Cross-Sectional Technologies | 19 | Expired |
| US6358762B1 | Manufacture method for semiconductor inspection apparatus | Electricity | 17 | Expired |
| US6507204B1 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Physics | 16 | Expired |
| US5232418A | Hydraulic actuator in automatic transmission | Mechanical Engineering; Lighting; Heating | 15 | Expired |
| US4716787A | Automatic transmission mechanism | Mechanical Engineering; Lighting; Heating | 13 | Expired |
| US4916977A | Automatic transmission | Mechanical Engineering; Lighting; Heating | 12 | Expired |
| US6774654B2 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6414530B2 | Semiconductor integrated circuit device, semiconductor memory system and clock synchronous circuit | Electricity | 10 | Expired |
| US6531327B2 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Physics | 9 | Expired |
| US6496023B1 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Emerging Cross-Sectional Technologies | 7 | Expired |
| US6566149B1 | Method for manufacturing substrate for inspecting semiconductor device | Physics | 7 | Expired |
| US7356742B2 | Method and apparatus for testing a memory device in quasi-operating conditions | Physics | 7 | Expired |
| US6828810B2 | Semiconductor device testing apparatus and method for manufacturing the same | Physics | 7 | Expired |
| US6826720B2 | Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory | Physics | 6 | Expired |
| US6479305B2 | Semiconductor device manufacturing method | Electricity | 5 | Expired |
| US5274594A | Static RAM | Physics | 5 | Expired |
| US4813301A | Automatic transmission | Mechanical Engineering; Lighting; Heating | 5 | Expired |
| US6548315B2 | Manufacture method for semiconductor inspection apparatus | Electricity | 4 | Expired |
| US6714030B2 | Semiconductor inspection apparatus | Electricity | 4 | Expired |
| US7018857B2 | Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe | Physics | 4 | Expired |
| US7341133B2 | Hydraulic circuit and hydraulic control unit for hydraulic power transmission | Mechanical Engineering; Lighting; Heating | 3 | Expired |
| US6573112B2 | Semiconductor device manufacturing method | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.