Inventor · Matsumoto, JP

Hitoshi Sumida

29Patents
6h-index
31Co-inventors
69Inventor score

Filing activity: Aug 15, 1994 → Jan 31, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US6057726A Output circuit for power IC with high breakdown voltage Electricity 18 Expired
US5485023A Insulated gate bipolar transistor Electricity 18 Expired
US6441432B1 High voltage lateral semiconductor device Electricity 16 Expired
US9761545B2 Isolator and method of manufacturing isolator Electricity 9 Active
US5572055A Insulated-gate bipolar transistor with reduced latch-up Electricity 8 Expired
US9818845B2 MOS-driven semiconductor device and method for manufacturing MOS-driven semiconductor device Electricity 7 Active
US9318784B2 Isolator and isolator manufacturing method Electricity 4 Active
US8014118B2 Load driving circuit, driver IC having a load driving circuit, and plasma display panel having a driver IC Physics 4 Active
US10727180B2 Resistive element and method of manufacturing the resistive element Electricity 3 Active
US5624855A Process of producing insulated-gate bipolar transistor Electricity 3 Expired
US9117797B2 High-voltage semiconductor device Electricity 2 Active
US9608072B2 Semiconductor device Electricity 2 Active
US7960937B2 Inverter unit, integrated circuit chip, and vehicle drive apparatus Emerging Cross-Sectional Technologies 2 Active
US10217765B2 Semiconductor integrated circuit Electricity 1 Active
US8664909B2 Inverter unit, integrated circuit chip, and vehicle drive apparatus Emerging Cross-Sectional Technologies 1 Active
US8742802B2 Gate driving circuit Electricity 1 Active
US11189685B2 Resistance element and manufacturing method of resistance element Electricity 0 Active
US8928368B2 Gate driving circuit Electricity 0 Active
US9698667B2 Semiconductor device and power converter equipment Electricity 0 Active
US8405343B2 Inverter unit, integrated circuit chip, and vehicle drive apparatus Emerging Cross-Sectional Technologies 0 Active
US10725087B2 Semiconductor integrated device and gate screening test method of the same Physics 0 Active
US9553185B2 MOS-driven semiconductor device and method for manufacturing MOS-driven semiconductor device Electricity 0 Active
US11699764B2 Semiconductor device and method of manufacturing the same Electricity 0 Active
US11233052B2 Method of manufacturing semiconductor integrated circuit Electricity 0 Active
US10825812B2 Semiconductor integrated circuit Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.