Hsu Kai Yang
33Patents
10h-index
14Co-inventors
72Inventor score
Filing activity: Dec 21, 1998 → Feb 27, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6392427B1 | Testing electronic devices | Electricity | 71 | Expired |
| US7852662B2 | Spin-torque MRAM: spin-RAM, array | Physics | 54 | Active |
| US7613868B2 | Method and system for optimizing the number of word line segments in a segmented MRAM array | Physics | 26 | Expired |
| US6295226A | Memory device having enhanced programming and/or erase characteristics | Electricity | 26 | Expired |
| US7184302B2 | Highly efficient segmented word line MRAM array | Physics | 25 | Expired |
| US7782661B2 | Boosted gate voltage programming for spin-torque MRAM array | Emerging Cross-Sectional Technologies | 18 | Active |
| US7499314B2 | Reference cell scheme for MRAM | Physics | 15 | Active |
| US6977838B1 | Method and system for providing a programmable current source for a magnetic memory | Physics | 13 | Expired |
| US7480172B2 | Programming scheme for segmented word line MRAM array | Physics | 11 | Active |
| US9170879B2 | Method and apparatus for scrubbing accumulated data errors from a memory system | Physics | 10 | Active |
| US7321507B2 | Reference cell scheme for MRAM | Physics | 10 | Active |
| US7085183B2 | Adaptive algorithm for MRAM manufacturing | Physics | 8 | Expired |
| US7362644B2 | Configurable MRAM and method of configuration | Physics | 8 | Expired |
| US8274819B2 | Read disturb free SMT MRAM reference cell circuit | Physics | 6 | Active |
| US8775865B2 | Method and apparatus for scrubbing accumulated disturb data errors in an array of SMT MRAM memory cells including rewriting reference bits | Physics | 4 | Active |
| US7977111B2 | Devices using addressable magnetic tunnel junction array to detect magnetic particles | Emerging Cross-Sectional Technologies | 4 | Active |
| US7224628B2 | Adaptive algorithm for MRAM manufacturing | Physics | 4 | Active |
| US8018758B2 | Gate drive voltage boost schemes for memory array | Physics | 3 | Active |
| US7609543B2 | Method and implementation of stress test for MRAM | Physics | 2 | Active |
| US7369430B2 | Adaptive algorithm for MRAM manufacturing | Physics | 2 | Active |
| US8654577B2 | Shared bit line SMT MRAM array with shunting transistors between bit lines | Physics | 2 | Active |
| US7321519B2 | Adaptive algorithm for MRAM manufacturing | Physics | 1 | Active |
| US8248841B2 | Boosted gate voltage programming for spin-torque MRAM array | Emerging Cross-Sectional Technologies | 1 | Active |
| US8437181B2 | Shared bit line SMT MRAM array with shunting transistors between the bit lines | Physics | 1 | Active |
| US7957183B2 | Single bit line SMT MRAM array architecture and the programming method | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.