Inventor · Suwon-si, KR

Hun-Jung Yi

17Patents
6h-index
31Co-inventors
62Inventor score

Filing activity: Jul 12, 2000 → Mar 26, 2014

Most-cited inventions

PatentTitleAreaCited byStatus
US7191545B2 Apparatus to dry substrates Electricity 18 Expired
US7556712B2 Laser cleaning of backside of wafer for photolithographic processing Electricity 18 Active
US6883248B2 Apparatus for drying a substrate using an isopropyl alcohol vapor Electricity 9 Expired
US6959823B2 Wafer guides for processing semiconductor substrates Emerging Cross-Sectional Technologies 8 Expired
US7351667B2 Etching solution for silicon oxide method of manufacturing a semiconductor device using the same Electricity 7 Active
US7943562B2 Semiconductor substrate cleaning methods, and methods of manufacture using same Chemistry; Metallurgy 6 Active
US6655042B2 System and method for drying semiconductor substrate Electricity 6 Expired
US7386944B2 Method and apparatus for drying a wafer, and an apparatus for cleaning and drying a wafer Emerging Cross-Sectional Technologies 5 Expired
US7880138B2 Apparatus and method for analyzing contaminants on wafer Physics 4 Active
US6395144B1 Method for treating toxic compounds-containing gas by non-thermal plasma Performing Operations; Transporting 3 Expired
US8043974B2 Semiconductor wet etchant and method of forming interconnection structure using the same Electricity 3 Active
US7100306B2 Wafer guides for processing semiconductor substrates Emerging Cross-Sectional Technologies 3 Expired
US7520068B2 Apparatus and method for drying semiconductor substrates Electricity 1 Expired
US6905570B2 Apparatus for manufacturing integrated circuit device Electricity 1 Expired
US7959884B2 Apparatus for purifying air and purifying method thereof Emerging Cross-Sectional Technologies 0 Active
US8767203B2 Plasma monitoring device using a cylindrical hollow electrode Electricity 0 Active
US9267882B2 Apparatus for detecting organic compounds and apparatus for manufacturing display device using the same Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.