Inventor · San Jose, CA, US

James E. Nulty

18Patents
9h-index
25Co-inventors
68Inventor score

Filing activity: Sep 26, 1989 → Jan 11, 2008

Most-cited inventions

PatentTitleAreaCited byStatus
US5468342A Method of etching an oxide layer Emerging Cross-Sectional Technologies 347 Expired
US5562801A Method of etching an oxide layer Electricity 131 Expired
US5013400A Dry etch process for forming champagne profiles, and dry etch apparatus Electricity 65 Expired
US5045149A Method and apparatus for end point detection Physics 36 Expired
US4954212A Endpoint detection system and method for plasma etching Electricity 26 Expired
US6066555A Method for eliminating lateral spacer erosion on enclosed contact topographies during RF sputter cleaning Electricity 21 Expired
US5441596A Method for forming a stable plasma Electricity 19 Expired
US6847218B1 Probe card with an adapter layer for testing integrated circuits Physics 17 Expired
US6372634B1 Plasma etch chemistry and method of improving etch control Electricity 15 Expired
US6165375A Plasma etching method Electricity 9 Expired
US6784552B2 Structure having reduced lateral spacer erosion Electricity 7 Expired
US7332921B2 Probe card and method for constructing same Emerging Cross-Sectional Technologies 6 Expired
US6406640B1 Plasma etching method Electricity 6 Expired
US6214743A Method and structure for making self-aligned contacts Electricity 6 Expired
US7112975B1 Advanced probe card and method of fabricating same Electricity 5 Expired
US6373679B1 ELECTROSTATIC OR MECHANICAL CHUCK ASSEMBLY CONFERRING IMPROVED TEMPERATURE UNIFORMITY ONTO WORKPIECES HELD THEREBY, WORKPIECE PROCESSING TECHNOLOGY AND/OR APPARATUS CONTAINING THE SAME, AND METHOD(S) FOR HOLDING AND/OR PROCESSING A WORKPIECE WITH THE SAME Electricity 4 Expired
US7685705B2 Method of fabricating a probe card Emerging Cross-Sectional Technologies 1 Active
US6890860B1 Method for etching and/or patterning a silicon-containing layer Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.