Inventor · Santa Cruz, CA, US

James P. Cruse

38Patents
10h-index
64Co-inventors
74Inventor score

Filing activity: Sep 5, 1995 → Nov 27, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US8496756B2 Methods for processing substrates in process systems having shared resources Electricity 501 Active
US7955646B2 Elimination of flow and pressure gradients in low utilization processes Electricity 362 Active
US5910011A Method and apparatus for monitoring processes using multiple parameters of a semiconductor wafer processing system Electricity 126 Expired
US8513889B2 Methods and apparatus for tuning matching networks Electricity 51 Active
US7968469B2 Method of processing a workpiece in a plasma reactor with variable height ground return path to control plasma ion density uniformity Electricity 39 Active
US6660659B1 Plasma method and apparatus for processing a substrate Electricity 29 Expired
US5925212A Apparatus and method for attaining repeatable temperature versus time profiles for plasma heated interactive parts used in mass production plasma processing Electricity 24 Expired
US7846497B2 Method and apparatus for controlling gas flow to a processing chamber Emerging Cross-Sectional Technologies 23 Active
US7775236B2 Method and apparatus for controlling gas flow to a processing chamber Emerging Cross-Sectional Technologies 13 Active
US8074677B2 Method and apparatus for controlling gas flow to a processing chamber Emerging Cross-Sectional Technologies 11 Active
US8845816B2 Method extending the service interval of a gas distribution plate Emerging Cross-Sectional Technologies 8 Active
US7605008B2 Plasma ignition and complete faraday shielding of capacitive coupling for an inductively-coupled plasma Electricity 8 Active
US7645709B2 Methods for low temperature oxidation of a semiconductor device Electricity 8 Active
US6652710B2 Process monitoring apparatus and method Electricity 8 Expired
US7988815B2 Plasma reactor with reduced electrical skew using electrical bypass elements Electricity 8 Active
US8707754B2 Methods and apparatus for calibrating flow controllers in substrate processing systems Emerging Cross-Sectional Technologies 8 Active
US8992689B2 Method for removing halogen-containing residues from substrate Electricity 8 Active
US8076247B2 Plasma process uniformity across a wafer by controlling RF phase between opposing electrodes Electricity 7 Active
US7879731B2 Improving plasma process uniformity across a wafer by apportioning power among plural VHF sources Electricity 7 Active
US7552736B2 Process for wafer backside polymer removal with a ring of plasma under the wafer Electricity 6 Active
US7743670B2 Method and apparatus for gas flow measurement Emerging Cross-Sectional Technologies 5 Active
US8080479B2 Plasma process uniformity across a wafer by controlling a variable frequency coupled to a harmonic resonator Electricity 5 Active
US7975558B2 Method and apparatus for gas flow measurement Emerging Cross-Sectional Technologies 4 Active
US7994872B2 Apparatus for multiple frequency power application Electricity 4 Active
US8237517B2 Apparatus for multiple frequency power application Electricity 3 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.