Mark Meloni
35Patents
10h-index
46Co-inventors
75Inventor score
Filing activity: Mar 8, 1999 → Feb 11, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8599301B2 | Arrayed imaging systems having improved alignment and associated methods | Electricity | 132 | Active |
| US9418193B2 | Arrayed imaging systems having improved alignment and associated methods | Electricity | 121 | Active |
| US10002215B2 | Arrayed imaging systems having improved alignment and associated methods | Electricity | 111 | Active |
| US6991514B1 | Optical closed-loop control system for a CMP apparatus and method of manufacture thereof | Performing Operations; Transporting | 109 | Expired |
| US7339682B2 | Heterodyne reflectometer for film thickness monitoring and method for implementing | Physics | 43 | Expired |
| US6685537B1 | Polishing pad window for a chemical mechanical polishing tool | Performing Operations; Transporting | 32 | Expired |
| US6290584A | Workpiece carrier with segmented and floating retaining elements | Performing Operations; Transporting | 30 | Expired |
| US6264532A | Ultrasonic methods and apparatus for the in-situ detection of workpiece loss | Performing Operations; Transporting | 21 | Expired |
| US6466642B1 | Methods and apparatus for the in-situ measurement of CMP process endpoint | Physics | 19 | Expired |
| US6960115B2 | Multiprobe detection system for chemical-mechanical planarization tool | Electricity | 11 | Expired |
| US6805613B1 | Multiprobe detection system for chemical-mechanical planarization tool | Electricity | 9 | Expired |
| US6273792A | Method and apparatus for in-situ measurement of workpiece displacement during chemical mechanical polishing | Performing Operations; Transporting | 6 | Expired |
| US6283836A | Non-abrasive conditioning for polishing pads | Emerging Cross-Sectional Technologies | 5 | Expired |
| US6287171A | System and method for detecting CMP endpoint via direct chemical monitoring of reactions | Performing Operations; Transporting | 5 | Expired |
| US8366874B2 | Removing and segregating components from printed circuit boards | Emerging Cross-Sectional Technologies | 5 | Active |
| US7589843B2 | Self referencing heterodyne reflectometer and method for implementing | Physics | 5 | Active |
| US10365212B2 | System and method for calibration of optical signals in semiconductor process systems | Electricity | 3 | Active |
| US8582115B2 | Tunable and switchable multilayer optical devices | Physics | 2 | Active |
| US8572831B2 | Disassembling an item by means of RF energy | Emerging Cross-Sectional Technologies | 2 | Active |
| US9383323B2 | Workpiece characterization system | Physics | 2 | Active |
| US8807189B2 | Removing and segregating components from printed circuit boards | Emerging Cross-Sectional Technologies | 1 | Active |
| US10925767B2 | Laser doppler vibrometry for eye surface vibration measurement to determine cell damage | Human Necessities | 1 | Active |
| US9310250B1 | High dynamic range measurement system for process monitoring | Physics | 1 | Active |
| US10679832B2 | Microwave plasma source | Electricity | 1 | Active |
| US10794763B2 | Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.