Michael Rogalli
16Patents
4h-index
32Co-inventors
60Inventor score
Filing activity: Sep 5, 1989 → Aug 22, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6790737B2 | Method for fabricating thin metal layers from the liquid phase | Electricity | 29 | Expired |
| US6958256B2 | Process for the back-surface grinding of wafers | Electricity | 8 | Expired |
| US5917705A | Chip card | Electricity | 6 | Expired |
| US5468786A | Radiation-curable reaction resin system | Chemistry; Metallurgy | 4 | Expired |
| US9165821B2 | Method for providing a self-aligned pad protection in a semiconductor device | Electricity | 3 | Active |
| US5780103A | Method for forming of a silicon oxide layer on a topography | Electricity | 2 | Expired |
| US10103123B2 | Semiconductor devices and processing methods | Electricity | 2 | Active |
| US5227219A | Surface wave components with an acoustically matched damping compound | Emerging Cross-Sectional Technologies | 2 | Expired |
| US6380076B2 | Dielectric filling of electrical wiring planes | Electricity | 1 | Expired |
| US12040288B2 | Chip package and method of forming a chip package | Electricity | 0 | Active |
| US11424201B2 | Method of forming an aluminum oxide layer, metal surface with aluminum oxide layer, and electronic device | Electricity | 0 | Active |
| US11735534B2 | Chip package and method of forming a chip package | Electricity | 0 | Active |
| US9385031B2 | Method for providing a self-aligned pad protection in a semiconductor device | Electricity | 0 | Active |
| US9418937B2 | Integrated circuit and method of forming an integrated circuit | Electricity | 0 | Active |
| US10446469B2 | Semiconductor device having a copper element and method of forming a semiconductor device having a copper element | Electricity | 0 | Active |
| US7169716B2 | Photosensitive lacquer for providing a coating on a semiconductor substrate or a mask | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.