Ming Chen
103Patents
12h-index
170Co-inventors
89Inventor score
Filing activity: Nov 15, 1993 → Jun 29, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5896294A | Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring | Emerging Cross-Sectional Technologies | 95 | Expired |
| US5905434A | Vehicle communication device | Performing Operations; Transporting | 87 | Expired |
| US5917332A | Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer | Physics | 71 | Expired |
| US5866437A | Dynamic process window control using simulated wet data from current and previous layer data | Electricity | 60 | Expired |
| US6041270A | Automatic recipe adjust and download based on process control window | Electricity | 60 | Expired |
| US5999003A | Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification | Physics | 46 | Expired |
| US5966459A | Automatic defect classification (ADC) reclassification engine | Physics | 37 | Expired |
| US5862055A | Automatic defect classification individual defect predicate value retention | Physics | 30 | Expired |
| US6185511A | Method to accurately determine classification codes for defects during semiconductor manufacturing | Physics | 20 | Expired |
| US5710755A | Communication system for control applications | Physics | 20 | Expired |
| US6035244A | Automatic defect reclassification of known propagator defects | Physics | 16 | Expired |
| US6154711A | Disposition tool for factory process control | Electricity | 13 | Expired |
| US6055437A | Dynamic allocation of communication resources | Electricity | 12 | Expired |
| US5946213A | Intelligent adc reclassification of previously classified propagator defects | Electricity | 12 | Expired |
| US6603559B2 | Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring | Physics | 11 | Expired |
| US6098024A | System for process data association using LaPlace Everett interpolation | Electricity | 10 | Expired |
| US6011619A | Semiconductor wafer optical scanning system and method using swath-area defect limitation | Physics | 10 | Expired |
| US6174738A | Critical area cost disposition feedback system | Electricity | 7 | Expired |
| US10217391B2 | Shift register unit, gate driving circuit and driving method thereof, and display apparatus | Physics | 6 | Active |
| US5972728A | Ion implantation feedback monitor using reverse process simulation tool | Electricity | 5 | Expired |
| US8627259B2 | Capacitance modification without affecting die area | Emerging Cross-Sectional Technologies | 5 | Active |
| US11004382B2 | Backlight source and manufacture method thereof, display device | Physics | 4 | Active |
| US10643553B2 | Backlight driving circuit, backlight driving method, backlight device and display device | Physics | 2 | Active |
| US11257439B2 | Data transmission method and device, display screen, and display device | Physics | 2 | Active |
| US7477631B2 | Method of controlling signal transmission in a local area network | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.