Ravi Kumar
30Patents
5h-index
37Co-inventors
65Inventor score
Filing activity: Dec 28, 2011 → Jul 27, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9857992B2 | Dynamic window to improve NAND endurance | Physics | 34 | Active |
| US9164836B2 | Cycling endurance extending for memory cells of a non-volatile memory array | Physics | 12 | Active |
| US9330784B2 | Dynamic window to improve NAND endurance | Physics | 10 | Active |
| US10705966B1 | Mapping for multi-state programming of memory devices | Physics | 5 | Active |
| US11404127B1 | Read refresh to improve power on data retention for a non-volatile memory | Physics | 5 | Active |
| US11361834B1 | Systems and methods for dual-pulse programming | Physics | 5 | Active |
| US11342035B1 | Memory apparatus and method of operation using one pulse smart verify | Physics | 2 | Active |
| US11508440B1 | Periodic write to improve data retention | Electricity | 1 | Active |
| US11177002B1 | Programming memory cells using encoded TLC-fine | Physics | 1 | Active |
| US11475961B1 | Nonvolatile memory with efficient look-ahead read | Physics | 1 | Active |
| US11475967B1 | Modified verify in a memory device | Electricity | 1 | Active |
| US11568943B2 | Memory apparatus and method of operation using zero pulse smart verify | Physics | 1 | Active |
| US11372765B2 | Mapping for multi-state programming of memory devices | Physics | 1 | Active |
| US11398280B1 | Lockout mode for reverse order read operation | Electricity | 1 | Active |
| US11302409B2 | Programming techniques including an all string verify mode for single-level cells of a memory device | Physics | 0 | Active |
| US10990311B2 | Multi-stream non-volatile storage system | Physics | 0 | Active |
| US12046306B2 | Temperature dependent programming techniques in a memory device | Physics | 0 | Active |
| US12099728B2 | Non-volatile memory with programmable resistance non-data word line | Physics | 0 | Active |
| US11417393B2 | Two-stage programming using variable step voltage (DVPGM) for non-volatile memory structures | Physics | 0 | Active |
| US12254218B2 | Read schemes with adjustment for neighboring word line sanitization | Physics | 0 | Active |
| US11574693B2 | Memory apparatus and method of operation using periodic normal erase dummy cycle to improve stripe erase endurance and data retention | Physics | 0 | Active |
| US12027218B2 | Location dependent sense time offset parameter for improvement to the threshold voltage distribution margin in non-volatile memory structures | Electricity | 0 | Active |
| US11972809B2 | Selective inhibit bitline voltage to cells with worse program disturb | Electricity | 0 | Active |
| US11557358B2 | Memory apparatus and method of operation using adaptive erase time compensation for segmented erase | Physics | 0 | Active |
| US11409443B2 | Intelligent memory wear leveling | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.