Roger Alvis
16Patents
8h-index
17Co-inventors
69Inventor score
Filing activity: Feb 27, 1995 → Oct 30, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5918149A | Deposition of a conductor in a via hole or trench | Electricity | 70 | Expired |
| US5650343A | Self-aligned implant energy modulation for shallow source drain extension formation | Electricity | 25 | Expired |
| US5713667A | Temperature sensing probe for microthermometry | Emerging Cross-Sectional Technologies | 12 | Expired |
| US6455385B1 | Semiconductor fabrication with multiple low dose implant | Electricity | 11 | Expired |
| US5710052A | Scanning spreading resistance probe | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6427345B1 | Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surface | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6293698A | Method for precise temperature sensing and control of semiconductor structures | Physics | 10 | Expired |
| US5935867A | Shallow drain extension formation by angled implantation | Electricity | 9 | Expired |
| US5864199A | Electron beam emitting tungsten filament | Electricity | 5 | Expired |
| US5727978A | Method of forming electron beam emitting tungsten filament | Electricity | 4 | Expired |
| US10453646B2 | Tomography-assisted TEM prep with requested intervention automation workflow | Electricity | 2 | Active |
| US5536940A | Energy filtering for electron back-scattered diffraction patterns | Electricity | 1 | Expired |
| US11513079B2 | Method and system for wafer defect inspection | Physics | 0 | Active |
| US11004651B2 | Tomography-assisted TEM prep with requested intervention automation workflow | Electricity | 0 | Active |
| US5707484A | Method of accurate compositional analysis of dielectric films on semiconductors | Electricity | 0 | Expired |
| US9797923B2 | Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.