Tianchun Ye
15Patents
1h-index
32Co-inventors
50Inventor score
Filing activity: Aug 17, 2012 → Feb 8, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10644020B2 | Three-dimensional semiconductor memory device with a substrate contact region and method of manufacturing the same | Electricity | 7 | Active |
| US10483279B2 | Method of manufacturing a semiconductor device | Electricity | 1 | Active |
| US11056580B2 | Semiconductor device and manufacturing method thereof | Electricity | 1 | Active |
| US9196706B2 | Method for manufacturing P-type MOSFET | Electricity | 1 | Active |
| US10504916B2 | Semiconductor device and method of manufacturing the same | Electricity | 1 | Active |
| US11839085B2 | Three-dimensional vertical single transistor ferroelectric memory and manufacturing method thereof | Electricity | 1 | Active |
| US11069808B2 | Negative capacitance field effect transistor and method for manufacturing the same | Electricity | 0 | Active |
| US11411091B2 | Structure of stacked gate-all-around nano-sheet CMOS device and method for manufacturing the same | Electricity | 0 | Active |
| US12088323B2 | Read-write method and apparatus for LEPS soft decoding estimation, and electronic device | Physics | 0 | Active |
| US12197282B2 | Data recovery method for flash memory | Physics | 0 | Active |
| US11929304B2 | Semiconductor apparatus with heat dissipation conduit in sidewall interconnection structure, method of manufacturing the same, and electronic device | Electricity | 0 | Active |
| US10991877B2 | Multi-state memory and method for manufacturing the same | Physics | 0 | Active |
| US11594608B2 | Method for forming gate-all-around nanowire device | Electricity | 0 | Active |
| US9111995B2 | Method for improving anti-radiation performance of SOI structure | Electricity | 0 | Active |
| US9419108B2 | Semiconductor structure and method for manufacturing the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.