Xinglong Chen
56Patents
23h-index
82Co-inventors
87Inventor score
Filing activity: Feb 2, 2007 → Sep 24, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9153442B2 | Processing systems and methods for halide scavenging | Electricity | 217 | Active |
| US9132436B2 | Chemical control features in wafer process equipment | Electricity | 197 | Active |
| US9023732B2 | Processing systems and methods for halide scavenging | Electricity | 184 | Active |
| US9093371B2 | Processing systems and methods for halide scavenging | Electricity | 183 | Active |
| US8969212B2 | Dry-etch selectivity | Electricity | 182 | Active |
| US9144147B2 | Semiconductor processing system and methods using capacitively coupled plasma | Electricity | 182 | Active |
| US9184055B2 | Processing systems and methods for halide scavenging | Electricity | 178 | Active |
| US9384997B2 | Dry-etch selectivity | Electricity | 145 | Active |
| US9362130B2 | Enhanced etching processes using remote plasma sources | Electricity | 137 | Active |
| US9373517B2 | Semiconductor processing with DC assisted RF power for improved control | Electricity | 135 | Active |
| US9449850B2 | Processing systems and methods for halide scavenging | Electricity | 134 | Active |
| US9659792B2 | Processing systems and methods for halide scavenging | Electricity | 121 | Active |
| US9704723B2 | Processing systems and methods for halide scavenging | Electricity | 114 | Active |
| US8894767B2 | Flow control features of CVD chambers | Emerging Cross-Sectional Technologies | 105 | Active |
| US9978564B2 | Chemical control features in wafer process equipment | Electricity | 105 | Active |
| US9991134B2 | Processing systems and methods for halide scavenging | Electricity | 100 | Active |
| US10062587B2 | Pedestal with multi-zone temperature control and multiple purge capabilities | Electricity | 95 | Active |
| US10032606B2 | Semiconductor processing with DC assisted RF power for improved control | Electricity | 94 | Active |
| US9593421B2 | Particle generation suppressor by DC bias modulation | Electricity | 55 | Active |
| US9267739B2 | Pedestal with multi-zone temperature control and multiple purge capabilities | Electricity | 52 | Active |
| US10256079B2 | Semiconductor processing systems having multiple plasma configurations | Electricity | 39 | Active |
| US10354843B2 | Chemical control features in wafer process equipment | Electricity | 38 | Active |
| US10283321B2 | Semiconductor processing system and methods using capacitively coupled plasma | Electricity | 35 | Active |
| US9892888B2 | Particle generation suppresor by DC bias modulation | Electricity | 23 | Active |
| US9502218B2 | RPS assisted RF plasma source for semiconductor processing | Electricity | 7 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.