Inventor · Zhubei City, TW

Chen-Han Wang

26Patents
2h-index
24Co-inventors
53Inventor score

Filing activity: Jan 15, 2014 → Jan 24, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US10438948B2 Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures Electricity 3 Active
US11296187B2 Seal material for air gaps in semiconductor devices Electricity 3 Active
US11688766B2 Seal material for air gaps in semiconductor devices Electricity 1 Active
US11264485B2 Spacer structure for semiconductor device Electricity 1 Active
US12119404B2 Gate all around structure with additional silicon layer and method for forming the same Electricity 1 Active
US11430891B2 Gate all around structure with additional silicon layer and method for forming the same Electricity 1 Active
US11626482B2 Air spacer formation with a spin-on dielectric material Emerging Cross-Sectional Technologies 0 Active
US11735666B2 Gate all around structure with additional silicon layer and method for forming the same Electricity 0 Active
US11502166B2 Seal material for air gaps in semiconductor devices Electricity 0 Active
US10461079B2 Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures Electricity 0 Active
US11942358B2 Low thermal budget dielectric for semiconductor devices Electricity 0 Active
US12308312B2 Interconnect structure and method for manufacturing the interconnect structure Electricity 0 Active
US12363980B2 Spacer structure for semiconductor device Electricity 0 Active
US11848238B2 Methods for manufacturing semiconductor devices with tunable low-k inner air spacers Electricity 0 Active
US11480606B2 In-line device electrical property estimating method and test structure of the same Electricity 0 Active
US11257753B2 Interconnect structure and method for manufacturing the interconnect structure Electricity 0 Active
US12412779B2 Bilayer seal material for air gaps in semiconductor devices Electricity 0 Active
US11901220B2 Bilayer seal material for air gaps in semiconductor devices Electricity 0 Active
US11637062B2 Interconnect structure and method for manufacturing the interconnect structure Electricity 0 Active
US9496398B2 Epitaxial source/drain regions in FinFETs and methods for forming the same Electricity 0 Active
US12094952B2 Air spacer formation with a spin-on dielectric material Emerging Cross-Sectional Technologies 0 Active
US12324200B2 Seal material for air gaps in semiconductor devices Electricity 0 Active
US12360153B2 In-line device electrical property estimating method and test structure of the same Electricity 0 Active
US11063042B2 Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures Electricity 0 Active
US12376321B2 Semiconductor device with silicide structures surrounding epitaxial structures and method of making the same Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.