Chieh Lee
17Patents
1h-index
21Co-inventors
46Inventor score
Filing activity: Jan 10, 2017 → Jun 14, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10714201B2 | Memory system capable of pre-screening internal transistors | Physics | 1 | Active |
| US11676641B2 | Memory systems with vertical integration | Electricity | 1 | Active |
| US12014768B2 | DRAM computation circuit and method | Electricity | 1 | Active |
| US12063786B2 | Compute-in-memory device and method | Physics | 0 | Active |
| US12217790B2 | Memory array connections | Physics | 0 | Active |
| US12362017B2 | Memory device with reduced area | Electricity | 0 | Active |
| US12400692B2 | Memory device and manufacturing method and test method of the same | Physics | 0 | Active |
| US12249390B2 | Memory systems with vertical integration | Electricity | 0 | Active |
| US12426231B2 | Structures of sram cell and methods of fabricating the same | Electricity | 0 | Active |
| US12243589B2 | Memory device and method for operating the same | Physics | 0 | Active |
| US12068023B2 | Memory circuits, memory structures, and methods for fabricating a memory device | Electricity | 0 | Active |
| US12414288B2 | Semiconductor device with a vertical channel wrapped around gate, and method for manufacturing the same | Electricity | 0 | Active |
| US11984165B2 | Memory device with reduced area | Electricity | 0 | Active |
| US11783905B2 | Anti-fuse memory device, memory array, and programming method of an anti-fuse memory device for preventing leakage current and program disturbance | Physics | 0 | Active |
| US10176883B2 | Power-up sequence protection circuit for avoiding unexpected power-up voltage | Emerging Cross-Sectional Technologies | 0 | Active |
| US12322435B2 | Sense amplifier with read circuit for compute-in-memory | Physics | 0 | Active |
| US12394469B2 | DRAM computation circuit and method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.