Ching-Chen Hao
18Patents
4h-index
21Co-inventors
56Inventor score
Filing activity: Jan 24, 2003 → May 2, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8314483B2 | On-chip heat spreader | Electricity | 25 | Active |
| US8168529B2 | Forming seal ring in an integrated circuit die | Electricity | 20 | Active |
| US8890293B2 | Guard ring for through vias | Electricity | 9 | Active |
| US6756291B1 | Method for hardening gate oxides using gate etch process | Electricity | 4 | Expired |
| US8742583B2 | Seal ring in an integrated circuit die | Electricity | 4 | Active |
| US8609506B2 | On-chip heat spreader | Electricity | 2 | Active |
| US8779572B2 | On-chip heat spreader | Electricity | 2 | Active |
| US10163727B2 | MOS devices with thinned gate spacers and methods of thinning the gate spacers | Electricity | 1 | Active |
| US9871035B2 | Semiconductor device with metal silicide blocking region and method of manufacturing the same | Electricity | 1 | Active |
| US9153690B2 | MOS devices with modulated performance and methods for forming the same | Electricity | 1 | Active |
| US6995064B2 | Halogen gettering method for forming field effect transistor (FET) device | Electricity | 1 | Expired |
| US9136340B2 | Doped protection layer for contact formation | Electricity | 1 | Active |
| US9502346B2 | Integrated circuit with a sidewall layer and an ultra-thick metal layer and method of making | Electricity | 0 | Active |
| US6949471B2 | Method for fabricating poly patterns | Electricity | 0 | Expired |
| US9647087B2 | Doped protection layer for contact formation | Electricity | 0 | Active |
| US9991123B2 | Doped protection layer for contact formation | Electricity | 0 | Active |
| US9947577B2 | Integrated circuit with a sidewall layer and an ultra-thick metal layer and method of making | Electricity | 0 | Active |
| US9666483B2 | Integrated circuit having thinner gate dielectric and method of making | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.