Inventor · Cupertino, CA, US

Kuei-Chang Tsai

16Patents
6h-index
26Co-inventors
66Inventor score

Filing activity: Feb 25, 1997 → Apr 6, 2017

Most-cited inventions

PatentTitleAreaCited byStatus
US6566196B1 Sidewall protection in fabrication of integrated circuits Emerging Cross-Sectional Technologies 25 Expired
US8941089B2 Resistive switching devices and methods of formation thereof Electricity 13 Active
US7297628B2 Dynamically controllable reduction of vertical contact diameter through adjustment of etch mask stack for dielectric etch Electricity 10 Expired
US8866122B1 Resistive switching devices having a buffer layer and methods of formation thereof Electricity 10 Active
US6336787B1 Method for transferring wafers in a semiconductor tape-peeling apparatus Emerging Cross-Sectional Technologies 9 Expired
US6384482B1 Method for forming a dielectric layer in a semiconductor device by using etch stop layers Electricity 7 Expired
US6017816A Method of fabricating A1N anti-reflection coating on metal layer Emerging Cross-Sectional Technologies 6 Expired
US6117780A Chemical mechanical polishing method with in-line thickness detection Electricity 5 Expired
US6984574B2 Cobalt silicide fabrication using protective titanium Electricity 2 Expired
US7375027B2 Method of providing contact via to a surface Electricity 1 Expired
US11056646B2 Memory device having programmable impedance elements with a common conductor formed below bit lines Physics 1 Active
US9412945B1 Storage elements, structures and methods having edgeless features for programmable layer(s) Electricity 0 Active
US10497868B2 Memory elements having conductive cap layers and methods therefor Physics 0 Active
US7071115B2 Use of multiple etching steps to reduce lateral etch undercut Electricity 0 Expired
US9595671B1 Methods of fabricating storage elements and structures having edgeless features for programmable layer(s) Electricity 0 Active
US7300745B2 Use of pedestals to fabricate contact openings Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.