Takao Yasue
23Patents
12h-index
6Co-inventors
70Inventor score
Filing activity: Dec 29, 1987 → May 2, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6249264A | Surface discharge type plasma display panel with intersecting barrier ribs | Electricity | 59 | Expired |
| US5652428A | Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere | Emerging Cross-Sectional Technologies | 49 | Expired |
| US5107114A | Fine scanning mechanism for atomic force microscope | Emerging Cross-Sectional Technologies | 35 | Expired |
| US4947042A | Tunnel unit and scanning head for scanning tunneling microscope | Emerging Cross-Sectional Technologies | 34 | Expired |
| US4880975A | Fine adjustment mechanism for a scanning tunneling microscope | Emerging Cross-Sectional Technologies | 27 | Expired |
| US5477732A | Adhesion measuring method | Electricity | 24 | Expired |
| US5469733A | Cantilever for atomic force microscope and method of manufacturing the cantilever | Emerging Cross-Sectional Technologies | 21 | Expired |
| US4945235A | Fine adjustment mechanism for a scanning tunneling microscope | Emerging Cross-Sectional Technologies | 18 | Expired |
| US5550372A | Apparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devices | Physics | 16 | Expired |
| US5060043A | Semiconductor wafer with notches | Emerging Cross-Sectional Technologies | 15 | Expired |
| US4837445A | Coarse adjusting device of scanning tunneling microscope | Emerging Cross-Sectional Technologies | 15 | Expired |
| US5193385A | Cantilever for use in atomic force microscope and manufacturing method therefor | Emerging Cross-Sectional Technologies | 12 | Expired |
| US6683589B2 | Surface discharge type plasma display panel with intersecting barrier ribs | Electricity | 8 | Expired |
| US5040048A | Metal interconnection layer having reduced hillock formation | Emerging Cross-Sectional Technologies | 7 | Expired |
| US5723982A | Apparatus for analyzing thin film property | Emerging Cross-Sectional Technologies | 6 | Expired |
| US4856297A | Transfer vessel device and method of transfer using the device | Mechanical Engineering; Lighting; Heating | 5 | Expired |
| US6417620B1 | Surface discharge plasma display panel having two-dimensional black stripes of specific size and shape | Electricity | 5 | Expired |
| US5236866A | Metal interconnection layer having reduced hillock formation in semi-conductor device and manufacturing method therefor | Emerging Cross-Sectional Technologies | 5 | Expired |
| US5530253A | Sample stage for scanning probe microscope head | Emerging Cross-Sectional Technologies | 5 | Expired |
| US6638129B2 | Surface discharge type plasma display panel with intersecting barrier ribs | Electricity | 3 | Expired |
| US5147824A | Semiconductor wafer | Emerging Cross-Sectional Technologies | 3 | Expired |
| US5088290A | Transfer vessel apparatus and method of storing samples | Performing Operations; Transporting | 2 | Expired |
| US5043148A | Transfer device | Emerging Cross-Sectional Technologies | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.