Inventor · Boise, ID, US

Terry R. Lee

141Patents
32h-index
47Co-inventors
90Inventor score

Filing activity: Mar 18, 1985 → Aug 19, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US5935263A Method and apparatus for memory array compressed data testing Physics 472 Expired
US6442644B1 Memory system having synchronous-link DRAM (SLDRAM) devices and controller Emerging Cross-Sectional Technologies 382 Expired
US8106520B2 Signal delivery in stacked device Emerging Cross-Sectional Technologies 285 Active
US6356106B1 Active termination in a multidrop memory system Electricity 226 Expired
US7120727B2 Reconfigurable memory module and method Physics 186 Expired
US6820181B2 Method and system for controlling memory accesses to memory modules having a memory hub architecture Physics 148 Expired
US6662304B2 Method and apparatus for bit-to-bit timing correction of a high speed memory bus Physics 137 Expired
US6284571A Lead frame assemblies with voltage reference plane and IC packages including same Electricity 129 Expired
US6871253B2 Data transmission circuit for memory subsystem, has switching circuit that selectively connects or disconnects two data bus segments to respectively enable data transmission or I/O circuit connection Emerging Cross-Sectional Technologies 110 Expired
US5276642A Method for performing a split read/write operation in a dynamic random access memory Physics 109 Expired
US7428644B2 System and method for selective memory module power management Emerging Cross-Sectional Technologies 105 Expired
US6982892B2 Apparatus and methods for a physical layout of simultaneously sub-accessible memory modules Emerging Cross-Sectional Technologies 100 Expired
US6735709B1 Method of timing calibration using slower data rate pattern Electricity 97 Expired
US7437579B2 System and method for selective memory module power management Emerging Cross-Sectional Technologies 90 Expired
US6044429A Method and apparatus for collision-free data transfers in a memory device with selectable data or address paths Physics 72 Expired
US6548757B1 Microelectronic device assemblies having a shielded input and methods for manufacturing and operating such microelectronic device assemblies Electricity 64 Expired
US5231605A DRAM compressed data test mode with expected data Physics 59 Expired
US6889357B1 Timing calibration pattern for SLDRAM Electricity 58 Expired
US5930182A Adjustable delay circuit for setting the speed grade of a semiconductor device Physics 46 Expired
US6330194A High speed I/O calibration using an input path and simplified logic Physics 46 Expired
US6898726B1 Memory system that sets a predetermined phase relationship between read and write clock signals at a bus midpoint for a plurality of spaced device locations Physics 46 Expired
US6549036B1 Simple output buffer drive strength calibration Electricity 45 Expired
US6392948B1 Semiconductor device with self refresh test mode Physics 45 Expired
US6256235A Adjustable driver pre-equalization for memory subsystems Physics 43 Expired
US6961259B2 Apparatus and methods for optically-coupled memory systems Physics 42 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.