Inventor · Munich, DE

Winfried Kamp

22Patents
6h-index
27Co-inventors
69Inventor score

Filing activity: Mar 17, 1989 → Nov 21, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US7755110B2 Architecture of function blocks and wirings in a structured ASIC and configurable driver cell of a logic cell zone Electricity 131 Active
US6735742B2 Method for optimizing a cell layout using parameterizable cells and cell configuration data Electricity 31 Expired
US7492187B2 Circuit arrangement for supplying configuration data in FPGA devices Electricity 23 Active
US7436694B2 Nonvolatile memory cell Physics 8 Active
US8854866B2 Identification circuit and method for generating an identification bit Physics 8 Active
US5027312A Carry-select adder Physics 8 Expired
US7932542B2 Method of fabricating an integrated circuit with stress enhancement Electricity 6 Active
US7881465B2 Circuit and method for calculating a logic combination of two encrypted input operands Electricity 6 Active
US7816198B2 Semiconductor device and method for manufacturing the same Electricity 5 Active
US7716270B2 Carry-ripple adder Physics 3 Active
US7487198B2 Multibit bit adder Electricity 2 Active
US7979828B2 Integrated circuit and method for determining an integrated circuit layout Physics 2 Active
US8331163B2 Latch based memory device Physics 2 Active
US6977831B2 Content addressable memory cell Physics 2 Expired
US8780648B2 Latch based memory device Physics 1 Active
US6978290B2 Carry ripple adder Physics 1 Expired
US7158396B2 CAM (content addressable memory) apparatus Physics 1 Expired
US4893269A Adder cell for carry-save arithmetic Physics 1 Expired
US7342423B2 Circuit and method for calculating a logical combination of two input operands Physics 1 Active
US7876893B2 Logic circuit and method for calculating an encrypted result operand Physics 0 Active
US7439765B2 Mask-programmable logic macro and method for programming a logic macro Electricity 0 Active
US7509561B2 Parity checking circuit for continuous checking of the parity of a memory cell Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.