Wolfgang Aderhold
53Patents
8h-index
61Co-inventors
81Inventor score
Filing activity: Oct 23, 1992 → Nov 27, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6215106A | Thermally processing a substrate | Chemistry; Metallurgy | 44 | Expired |
| US5343293A | Ellipsometer | Physics | 26 | Expired |
| US6164816A | Tuning a substrate temperature measurement system | Physics | 24 | Expired |
| US8111978B2 | Rapid thermal processing chamber with shower head | Electricity | 15 | Active |
| US8314371B2 | Rapid thermal processing chamber with micro-positioning system | Electricity | 14 | Active |
| US6803546B1 | Thermally processing a substrate | Electricity | 12 | Expired |
| US7398693B2 | Adaptive control method for rapid thermal processing of a substrate | Electricity | 11 | Active |
| US7414224B2 | Backside rapid thermal processing of patterned wafers | Mechanical Engineering; Lighting; Heating | 9 | Active |
| US8104951B2 | Temperature uniformity measurements during rapid thermal processing | Physics | 8 | Active |
| US8900889B2 | Rapid thermal processing chamber with micro-positioning system | Electricity | 8 | Active |
| US9245768B2 | Method of improving substrate uniformity during rapid thermal processing | Electricity | 7 | Active |
| US9390950B2 | Rapid thermal processing chamber with micro-positioning system | Electricity | 7 | Active |
| US9018110B2 | Apparatus and methods for microwave processing of semiconductor substrates | Electricity | 5 | Active |
| US8109669B2 | Temperature uniformity measurement during thermal processing | Physics | 5 | Active |
| US8249436B2 | System for non radial temperature control for rotating substrates | Electricity | 5 | Active |
| US8724977B2 | System for non radial temperature control for rotating substrates | Electricity | 4 | Active |
| US8865602B2 | Edge ring lip | Electricity | 4 | Active |
| US9564349B2 | Rapid thermal processing chamber with micro-positioning system | Electricity | 3 | Active |
| US8658945B2 | Backside rapid thermal processing of patterned wafers | Mechanical Engineering; Lighting; Heating | 3 | Active |
| US9728471B2 | System for non radial temperature control for rotating substrates | Electricity | 3 | Active |
| US9431278B2 | Backside rapid thermal processing of patterned wafers | Mechanical Engineering; Lighting; Heating | 2 | Active |
| US7778533B2 | Semiconductor thermal process control | Electricity | 2 | Expired |
| US7195934B2 | Method and system for deposition tuning in an epitaxial film growth apparatus | Emerging Cross-Sectional Technologies | 2 | Expired |
| US10741457B2 | System for non radial temperature control for rotating substrates | Electricity | 2 | Active |
| US7667162B2 | Semiconductor thermal process control utilizing position oriented temperature generated thermal mask | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.