Patent assignee · US · COMPANY

Magepower Semiconductor Corp.

14Patents
0Active
14Granted
31Portfolio score

Filing activity: Feb 20, 1996 → Sep 5, 2000

Most-cited patents

PatentTitleAreaCited byStatus
US6426260B1 Switching speed improvement in DMO by implanting lightly doped region under gate Electricity 139 Expired
US6005271A Semiconductor cell array with high packing density Electricity 113 Expired
US5907776A Method of forming a semiconductor structure having reduced threshold voltage and high punch-through tolerance Electricity 87 Expired
US6262453A Double gate-oxide for reducing gate-drain capacitance in trenched DMOS with high-dopant concentration buried-region under trenched gate Electricity 81 Expired
US6031265A Enhancing DMOS device ruggedness by reducing transistor parasitic resistance and by inducing breakdown near gate runners and termination area Electricity 75 Expired
US6051468A Method of forming a semiconductor structure with uniform threshold voltage and punch-through tolerance Electricity 69 Expired
US6172398A Trenched DMOS device provided with body-dopant redistribution-compensation region for preventing punch through and adjusting threshold voltage Electricity 52 Expired
US6049104A MOSFET device to reduce gate-width without increasing JFET resistance Emerging Cross-Sectional Technologies 28 Expired
US5973361A DMOS transistors with diffusion merged body regions manufactured with reduced number of masks and enhanced ruggedness Electricity 26 Expired
US5844277A Power MOSFETs and cell topology Electricity 19 Expired
US5894150A Cell density improvement in planar DMOS with farther-spaced body regions and novel gates Electricity 18 Expired
US6048759A Gate/drain capacitance reduction for double gate-oxide DMOS without degrading avalanche breakdown Electricity 17 Expired
US6404025B1 MOSFET power device manufactured with reduced number of masks by fabrication simplified processes Electricity 15 Expired
US5998266A Method of forming a semiconductor structure having laterally merged body layer Electricity 11 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.